Rohde & Schwarz Workshops
Paris, France – Sept. 28 to 30, 2010Attendance free of charge
All workshops take place in room Cartier 3
Please click headlines to see details about the workshops.Millimeter-Wave Applications
Tuesday, Sep. 28, 2010 10:00 - 11:00
- Signal generation with upconverters
- Spectrum analysis and phase noise measurement with external mixers
- True differential measurements in the mm-wave range with vector network analyzers
True Differential - Measurement vs. Calculation
Tuesday, Sep. 28, 2010 11:30 - 12:30
- True Differential versus Virtual Differential - what's the theory behind this
- How the amplifier structure influences the measurement
- Approaches for measurements on differential DUTs
- Comparison of True Differential and Virtual Differential results
Noise Parameter Measurement up to Millimeter-Wave Range
In cooperation with Focus Microwaves Inc
Tuesday, Sep. 28, 2010 13:30 - 14:30
- New method for measuring noise figure with a vector network analyzer
- Differences between noise figure and noise parameter
- Noise parameter measurement technique
Long-Distance Group Delay Measurements
Tuesday, Sep. 28, 2010 15:00 - 16:00
- Group delay measurement technique for downconverters with embedded LO
- Long-distance group delay applications and challenges
- Measurement solution with two vector network analyzers via LXI
- Practical demonstrations
Fast, Flexible Automated Pulsed IV/RF Measurements for Accurate Nonlinear Model Development
By NMDG N.V. and Auriga Microwaves
Tuesday, Sep. 28, 2010 16:30 - 17:30
- Definition of device characteristics to be captured by efficient large signal modeling.
- Case study of a device model extraction flow with focus on the measurement principles.
- Application for GaAs MESFET and GaN HEMT devices for flexible power amplifier design.
Connectivity of Rohde & Schwarz Instruments with
AWR® High-Frequency Design Software - LNA Design Example
In cooperation with AWR Corporation
Wednesday, Sep. 29, 2010 10:00 - 11:00
- Introduction to LNA design with AWR Microwave Office®
- Opportunities for tighter combination of simulation with test and measurement; use cases
- Connecting Rohde & Schwarz test instruments to AWR design environment™
- Practical demonstrations
System Simulation and Test of the Latest Communications Standards
In cooperation with AWR Corporation
Wednesday, Sep. 29, 2010 11:30 - 12:30
- Introduction to system simulation with AWR Visual System Simulator™ (VSS)
- Latest features for communications design
- Introduction to signal generation with R&S®WinIQSIM2™
- Easy generation of standard-compliant signals for LTE, HSPA+, WiMAX™, ...
- Additional features: multicarrier and multisegment functionality
- Practical demonstrations
Fast Nonlinear Device Characterization and PA Design Using VNAs
In cooperation with NMDG N.V., Focus Microwaves Inc. & AWR Corporation
Wednesday, Sep. 29, 2010 13:30 - 16:00
- Device measurement in a non-50 Ohm environment using multiple harmonics
- Extended VNAs provide realtime access to dynamic IV at multiple harmonics
- Overview of S-functions and their role in nonlinear modeling and the downstream design processes
- PA design using modern EDA solutions
Theoretical and Technical Background of Frequency Multipliers (50 GHz to 110 GHz)
Wednesday, Sep. 29, 2010 16:30 - 17:15
- Technical fundamentals
- Performance
- Limitations of a conventional setup
- Advantages of an integrated solution
- Applications
Basics of Modern Signal Generators
Thursday, Sep. 30, 2010 9:30 - 11:00
- Fundamental structures of signal generators
- Challenges in low phase noise and high output power
- High-performance analog and pulse modulations
- Practical demonstrations for typical applications
Distortion Analysis for Characterization and Modeling of Linear and Nonlinear Components
Thursday, Sep. 30, 2010 11:30 - 12:30
- Introduction - basic measurement task
- Theory of operation
- Signal flow
- Model calculation
- Practical measurement results
- Known data demodulator
- Software - results and features
Abstract:
The Rohde & Schwarz distortion analysis software enables designers of baseband and RF applications to measure and characterize active as well as passive components. The device under test (DUT) stimulus signal can be any signal provided numerically or by a reference measurement. Due to Volterra-based modeling, it is possible to measure nonlinear effects with and without memory as well as simple linear transfer functions. The software controls both the analyzer and the generator and defines all necessary settings such as level, frequency, etc. The results are available as numeric data and graphical output, providing a large number of different result evaluation functions. Import and export of numeric and graphical data is possible in a large variety of different formats.
Real-Time Spectrum Analysis Embedded in Modern Signal Analyzers
Thursday, Sep. 30, 2010 13:30 - 14:30
- What is realtime? - terms and definitions
- Signal, spectrum and real-time analyzer in one box
- Persistence mode for new insight into time-variant phenomena
- Real-time spectrogram for resolving frequency-hopping signals
- Frequency mask trigger – detection of events in the μs or even ns range
Abstract:
Modern spectrum analyzers are very fast instruments with a huge capture memory for the analysis of complex signals. However, digital signal processing causes dead time after every sweep or data capturing procedure. In many applications, very important information is lost due to these blind slots. In addition to spectrum analyzers, designers of synthesizers, radar systems or other transmitters therefore need instruments with real-time signal processing capability for their development and optimization tasks. An integrated, all-in-one combination of a signal analyzer, a spectrum analyzer and a real-time analyzer will be introduced in this workshop. In the real-time mode, it captures a 40 MHz wide signal and performs seamless calculation of FFTs. 250000 FFTs are calculated per second with at least 80 % overlap. The real-time spectrum is also displayed and the persistence mode or spectrogram can be used for visualizing time-variant effects. A frequency mask trigger (FMT) enables users to trigger on very short events in the frequency domain for detecting sporadic signals of interest.
Modern Techniques for Phase Noise Measurements
Thursday, Sep. 30, 2010 15:00 - 16:00
- Theory of phase noise testing
- Increased sensitivity through cross-correlation up to 50 GHz or higher
- Combination of spectrum analyzer and phase detector for phase noise testing
- Spur detection
- Residual phase noise
- AM noise
Abstract:
The measurement of oscillator phase noise is one of the primary tasks in RF technology. Phase noise has a crucial influence on modulation quality, receiver sensitivity and adjacent channel power in nearly all radar applications, especially in moving target indication. Modern implementations of phase noise measurement in T&M equipment combine different methods and support new technologies such as cross-correlation to reduce the test system noise floor. The R&S®FSUP signal source analyzer combines phase noise tester, VCO test suite, spectrum and signal analyzer in one unit. Using external mixers or dividers phase noise can be measured up to an offset frequency range of 10 GHz at input frequencies up to 50 GHz or even higher. In addition, effective algorithms for spur detection and additional measurements such as AM noise or residual phase noise for high-end applications are discussed.
Workshop registration
Come and visit us at
CNIT La Défense
Paris, France
Tue. 28 Sept. 9.30-17.30
Wed. 29 Sept. 9.30-17.30
Thu. 30 Sept. 9.30-16.30
Contact us
- Europe
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+49 1805 12 4242
customersupport@rohde-schwarz.com
- USA & Canada
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1-888-837-8772
customer.support@rsa.rohde-schwarz.com
- Latin America
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1-410-910-7988
customersupport.la@rohde-schwarz.com
- Asia
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+65 65 13 04 88
customersupport.asia@rohde-schwarz.com
