Search Application Notes & Cards
Learn how to configure Rohde & Schwarz products to fit your application. Search our database by product, technology, or application to find relevant technical documents.
Search Application Notes & Cards
Learn how to configure Rohde & Schwarz products to fit your application. Search our database by product, technology, or application to find relevant technical documents.
1119 Results
Synthetic aperture radar (SAR) uses radar wavelengths for airborne or spaceborne ground mapping. The resolution of the SAR ground map depends on the range and cross-range SAR processing resolution. Cross-range resolution is determined by integrating pulses along a flight path for a period of time to create a synthetic aperture. Longer synthetic apertures result in finer cross-range resolution. Range resolution is achieved by radar waveform bandwidth in the form of a linear frequency modulated (LFM) chirp. Wider bandwidth enables finer range resolution.
16-Apr-2021
The foregoing application note is intended for everyone who desires to become more familiar with the use and upload of custom data in ARB, digital modulation and RF list mode. Particularly, this note describes the instruments R&S® SMW200A, R&S® SGT100A, R&S® SMBV100A, R&S® SMU200A, R&S® SMJ100A and R&S® SMATE200A and provides an overview of already available solutions as well as it gives hints for the writing of own applications. Please also see the application note 1GP88 for the ARB Toolbox software and the application note 1GP96 for the CDM-Toolbox software.
22-Dec-2010 | AN-No. 1GP62
RTC, RTC1000, Application Card, Determining current-voltage characteristics with the oscilloscope With their included component tester, the R&S®RTC1000 oscilloscopes are universally deployable in development and educational environments. Determining current-voltage characteristics with the oscilloscope RTC, RTC1000, Application Card, Determining current-voltage characteristics with the oscilloscope
20-Dec-2017
Batteries are dynamic energy sources that diverge from ideal voltage sources. The R&S®NGM-K106 battery simulation option recreates battery models on the R&S®NGM200/NGU201 does far more than standard models.
02-May-2023
Electronic systems like electronic control units (ECU) must pass several stringent qualification tests in order to be approved for automotive use. These tests include a reverse polarity test which is specified as part of ISO 16750‑2. In line with the specification, the electronic module must withstand a negative supply voltage for a specific time without suffering any damage. The R&S®NGU401 source measurement unit (SMU) is ideal to perform this task, plus it provides automated testing capability.
23-May-2022
radio signals, radio services, sensitive radiocommunications systems, radio-controlled landing systems, automatic landing systems, air traffic control, UMS100, ARGUS Automatic monitoring of radio signals at airports interfering with radio services Automatic monitoring of radio signals at airports interfering with radio services radio signals, radio services, sensitive radiocommunications systems, radio-controlled
04-Sep-2006
Determining the delay of the video signal in relation to the audio signal aids evaluation of the quality of screens with an audio output. In some cases, such delays can reach as much as 100ms, which can cause significant irritation. This delay occurs because videosignal processing requires more computing power than audio-signal processing. The measurement solution described in this application note analyzes delays of up to +-400ms at a resolution in the order of µs.
21-Apr-2010 | AN-No. 7BM77
3-Port Adapter ZVR-B8 is an optional accessory to all Vector Network Analyzers of the ZVR family, namely ZVRL, ZVRE, and ZVR, and extends the two test ports PORT1 and PORT2 to a total of three test ports PORT1, PORT2 and PORT3. The option comprises an electronic single-pole double-throw switch (SPDT) by means of which PORT1 of the analyzer is switched to either PORT1 or PORT3 of 3-Port Adapter. Test port PORT2 of the analyzer is directly connected to PORT2 of the 3-Port Adapter and is not switched over.
04-Aug-1998 | AN-No. 1EZ26
The Internet of Things (IoT) is considered the driving force of current and future wireless communications. In release 13, 3GPP has specified Narrowband-IoT (NB-IoT) as a new physical layer. This application note gives a short introduction to NB-IoT and shows the easy measurements with Rohde & Schwarz instruments.
30-Jun-2017 | AN-No. 1MA296
Its dual-path concept and high-power signal generation up to 20 GHz make the R&S®SMW200A vector signal generator ideal for efficient testing of blocking characteristics
30-May-2014
The R&S®CMW-B400B audio board offers the flexibility to measure and quantify audio applications with the R&S®CMW270/280/500 radio communication testers.
20-Jun-2013
EMI compliance is becoming a major concern for advanced power electronics due to increasing switching speeds. Correlated time-frequency measurements help optimize gate driving and minimize electromagnetic emissions early on during development.
22-Nov-2018
Overview of the choices for downloading waveform data for remote processing
15-Feb-2018
Compliance testing is essential to ensuring that dynamic random access memory (DRAM) signals meet the JEDEC specifications for parameters such as timing, slew rates and voltage levels. For system verification and debugging, eye diagram measurements are the most important tools for efficiently analyzing the signal integrity in any digital design. The specific nature of DDR requires a dedicated solution with a powerful read/write separation to get meaningful eye diagrams on the DDR data bus.
19-Feb-2019
This application note describes how to test audio amplifier audio characteristic using the audio analyzer R&S® UPV in accordance with standard IEC 60268-3. The test items include gain, frequency response, harmonic distortion, modulation distortion, difference-tone intermodulation, dynamic intermodulation distortion, noise and cross-talk. The test items are explained and the test steps are described in detail.
13-Feb-2008 | AN-No. RCS0704-0032
Frequency converters e.g. in satellite transponders need to be characterized not only in terms of amplitude transmission but also in terms of phase transmission or group delay, especially with the transition to digital modulation schemes. They often do not provide access to the internal local oscillators. This application note describes a method using the R&S®ZNA analyzer family to measure group delay of mixers and frequency converters with an embedded local oscillator very accurately. The key aspect of this new technique is that the network analyzer applies a 2-tone signal to the frequency converter. By measuring the phase differences between the two signals at the input and at the output, it calculates group delay and relative phase.
11-Jul-2019 | AN-No. 1EZ81
The purpose of the test setup described is to ensure or to enhance the level accuracy of signal generators or the generator part of communication testers. The level accuracy of test signals is particularly important at low levels when measuring BER level sensitivity at digital communication receivers. The highly linear FSP spectrum analyzer is used in combination with a power meter to get the best possible accuracy with high measurement speed over a very wide level range.
18-Feb-2011 | AN-No. 1MA21
Your measurement task: To analyze an RF module via its digital interface. This Application Note explains how. As interfaces between the baseband and the RF modules of mobile radio base stations and terminals are increasingly digital, instruments for testing such modules need digital baseband interfaces as well. The R&S®EX-IQ-Box is a digital interface adapter that provides digital baseband I/O for Rohde & Schwarz signal generators and signal analyzers. An R&S signal analyzer with digital baseband interface R&S®FSQ-B17 can analyze digital baseband components input from the R&S®EX-IQ-Box. Data collected with a test-setup consisting of an R&S signal analyzer and the digital interface adapter R&S®EX-IQ-Box can be used in an Agilent ADS environment. For details of how to input the results to ADS, see Application Note 1MA72: 'Using R&S® Instruments within Agilent®ADS®Software'
26-Jun-2009 | AN-No. 1MA147
In the satellite sector, components, subsystems and entire satellites must be qualified in a thermal vacuum chamber before they can be used in space. This qualification proves that equipment can not only survive but also function in the harsh conditions encountered during launch and in space.
05-Oct-2022
Voice over IP for air traffic control
21-Sep-2015
This application note describes the use of R&S®GTSL and R&S®EGTSL in a .NET programming environment. It shows the user how libraries and drivers generated using the C programming language can be used in applications based on .NET technology.
08-Mar-2016 | AN-No. 1SE001
This application note and associated application software may be used to conduct psychoacoustic speech quality evaluation for Voice over LTE (VoLTE) connections. The measurements are based on recommendations ITU-T P.862 and ITU-T P.863, respectively.
21-Feb-2014 | AN-No. 1MA204
Rohde & Schwarz recognizes the potential risk of computer virus infection when connecting Windows®-based test instrumentation to other computers via local area networks (LANs), or using removable storage devices.This white paper introduces measures to minimize malware threats and discusses ways to mitigate risks while ensuring that instrument performance is not compromised.
16-Feb-2017 | AN-No. 1EB01
This Application Note describes testing S-parameters under pulsed conditions with the R&S®ZVA vector network analyzer and either the ZVAX24 Extension unit with pulse modular option or the R&S®SMF signal generator with pulse modulator as a signal source.In addition a constant power level calibration for applications requiring high drive power for test and measurement of device under test (DUT) is also included. A LDMOS S-band radar power transistor is used as example DUT. The pulse profile mode of the R&S®ZVA is used to analyze the time-dependent behavior of the DUT.
11-Apr-2013 | AN-No. 1MA126
This application note describes the principle of harmonic mixing and the requirements to be met by spectrum analyzers and external mixers.
05-Mar-1999 | AN-No. 1EF43
Enhanced Mobile Broadband, Massive Machine Type Communication, Ultra-reliable and low latency communication have been identified as the requirements to be supported by the 5thGeneration of Mobile Communication, short 5G. 5G is extensively discussed in the wireless industry. A lot of research and pre-development is being conducted worldwide, including an analysis of the waveforms and access principles that are the basis for current LTE and LTE-Advanced networks.In this application note we discuss potential 5G waveform candidates, list their advantages and disadvantages and compare them to Orthogonal Frequency Division Multiplexing (OFDM), which is used in LTE/LTE-Advanced.
10-Jun-2016 | AN-No. 1MA271
Power converter and inverter designs for higher power levels are usually based on hard switching half bridge configurations. In such setups, users must pay particular attention to proper switching operations to prevent shoot-through events. Setting up complex real-time trigger conditions using the R&S®RTE and R&S®RTO oscilloscopes increases the test coverage and robustness of converter and inverter systems.
10-Aug-2020
Due to its outstanding performance the R&S®SMW200A vector signal generator is ideal for testing MIMO receivers in a vast variety of applications offering maximum usability at minimum form factor. It can generate up to eight antenna signals simultaneously in its digital baseband – all standard-compliant and with antenna-specific coding. In addition, it can simulate the complete MIMO transmission channel with up to 32 fading channels, sufficient to emulate higher-order MIMO configurations such as 3x3, 4x4, and 8x4.This application note explains how to use the SMW for testing higher order MIMO systems by presenting different key applications.
24-Feb-2016 | AN-No. 1GP97
Vector network analyzers are used in high frequency applications to measure the complex scattering parameters of an unknown device-under-test (DUT). In general, the DUT characteristics can be evaluated by using electromagnetic waves. The correlation between the incident, reflected and transmitted wave quantities at the DUT is defined by its scattering matrix S.
28-Jul-1998 | AN-No. 1EZ30