News from Rohde & Schwarz 158 - 1998/II - Test Systems
Analog measurements in module production now even more efficient
 Multifunction Module AMV for Test Systems TSA and TSU
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The increasing density of components on PCBs coupled with the difficulty of accessing internal nodes via bed-of-nails fixture have put functional and final tests at PCB level to the fore. Rohde & Schwarz meets this challenge with its brand-new analog measurement technology for in-production testing of modules.
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