News from Rohde & Schwarz 186 - 2005/II - Test Systems
Floating, parallel signal analysis based on CompactPCI/PXI
 Signal Analyzer Module R&S TS-PAM for the R&S CompactTSVP
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  The Signal Analyzer Module R&S TS-PAM expands the range of measurement and switching modules for the Open Test Platform R&S CompactTSVP. These modules are used in function and in-circuit tests of electronic modules. A distinctive feature of the new module for multichannel and parallel data acquisition is floating measurement technology – which is in demand especially in the automotive industry.
 Related Products
Open Test Platform R&S CompactTSVP
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