RF Testing Innovations Forum

RF Testing Innovations Forum: Elevate your RF Expertise

Datum
Date

On-demand

Ort
Location

Online

Info
Info

Language: English
Free of charge

Virtual event

RF Testing Innovations Forum: Elevate your RF Expertise

With the growing use of satellite communications and defense systems, RF testing is becoming increasingly critical and complex.

The RF Testing Innovations Forum 2026, brought together engineers and specialists to discuss practical solutions for some of today's most demanding RF applications. The sessions are now available on demand, allowing you to access the content whenever it suits your schedule.

What You’ll Learn

  • Absolute phase measurements across a wide frequency range
  • Sub‑THz on‑wafer testing methods and best practices
  • Noise‑parameter validation techniques
  • Residual‑measurement approaches for high‑performance RF components

Explore the recordings to strengthen your expertise in RF innovation and stay up to date with the latest testing approaches.

Register now to access all videos on-demand!

RF Testing Innovation Forum 2026 Teaser - On demand

Keynote: The Commercialization of specialized Aerospace and Defense Components

Rohde & Schwarz, Markus Lörner

This session is about deriving clear test specifications from block‑diagram comparisons of RF subsystems, with the goal of simplifying and accelerating time‑to‑market for aerospace and defense RF components.

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Mastering RF Test validation for a power amplifier: From measurement to simulation and from S-Parameters to Complex Modulated Signals

Dassault, Tony Gasseling

This presentation explains why a unified orchestration platform is essential for RF power‑amplifier validation, covering data management (S‑parameters to complex modulated signals), multi‑instrument adaptability, and long‑term maintainability to maximise ROI.

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Absolute Phase: The Role of Clear Phases and Calibration

Rohde & Schwarz, Thorsten Lück / Chiara Villante

This session focuses on the critical role of calibrated phase information in RF measurements, reviewing calibration approaches (including comb‑generator traceability) and illustrating applications such as time‑domain transformations and frequency‑converter verification.

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Achieving accurate and repeatable D-Band on-wafer measurements

FormFactor, Giancarlo De Chirico/ Gavin Fisher

This presentation outlines best‑practice techniques for achieving accurate, stable, and repeatable D‑band on‑wafer S‑parameter measurements (up to 170 GHz) using a Rohde & Schwarz ZNA with frequency extenders, featuring a live demonstration from the FormFactor labs.

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Residual Measurements for Component Testing

Rohde & Schwarz, Florian Ramian

This session introduces the residual‑measurement methodology for active‑device characterization, showing how the new R&S®FSWX enables accurate, driver‑amplifier‑independent testing across a variety of use cases, supported by live demos.

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Optimizing RF Designs: Noise validation in RF circuit using up to 67 GHz

Focus Microwaves, Mehrdad Harifi-Mood

This presentation describes the cold‑source method for extracting LNA noise parameters, using the R&S®ZNA with the K30 noise‑figure option, and emphasizes calibration, verification, and traceability to ensure confidence across diverse device technologies and wide frequency ranges.

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Rohde & Schwarz presenters

Portrait image of Markus Lörner

Markus Lörner, Market Segment Manager – RF & Microwave Components

Markus Lörner is a Market Segment Manager at Rohde & Schwarz focusing on the RF and Microwave Component market looking at the test requirements today and tomorrow. Markus has 25 years plus experience in the test & measurement industry. Before moving into the market segment role, Markus worked as a product manager for signal generators and power meters at Rohde & Schwarz where he was looking at different application areas including the mobile industry, positioning, satellite and EW applications. He received his Dipl.-Ing. degree from the University Erlangen-Nuremberg, Germany.

Portrait image of Thorsten Lück

Thorsten Lück, Senior Project Manager High‑End Vector Network Analyzers

Thorsten Lück is Senior Project Manager for high‑end vector network analyzers at Rohde & Schwarz (since 2018). He leads product development and systems engineering for precision VNA instruments, with emphasis on instrument architecture, S‑parameter metrology, calibration, uncertainty quantification, and measurement automation. He collaborates with academic and industrial partners to translate measurement science into deployable solutions. Earlier he spent nearly 20 years in satellite navigation, developing a Galileo test receiver and leading an ESA‑funded signal‑integrity testbed.

Chiara Villante

Chiara Villante, Product Manager for High-End Vector Network Analyzers

Chiara Villante is Product Manager for High-End Vector Network Analyzers at Rohde & Schwarz. With a background in telecommunications systems, she has built broad experience in wireless and mobile communications, base station networks, and PCB technologies for RF boards.

In her current role, she focuses on high-end RF and microwave test solutions, particularly on vector network analyzer applications for demanding measurements and customer requirements. She holds a Master’s degree in Electronic Engineering from the Polytechnic University of Turin (Italy).

Portrait image of Florian Ramian

Florian Ramian, Development Engineer

Florian Ramian is a Development Engineer at Rohde&Schwarz, primarily focusing on the analysis of non-linear DUTs. Florian has 20 years of experience as an RF engineer including R&D for automotive radars as well as 15+ years of test and measurement experience. Before moving into R&D he held several positions as an Application Engineer for R&S Spectrum & Signal-Analyzers and Researcher at TU München. He received his Dr.-Ing. and Dipl.-Ing. degrees both from Technische Universität München.

Partners presenters

Portrait image of Tony Gasseling

Tony Gasseling, SIMULIA R&D Technical Director, Dassault Systèmes

Tony Gasseling is SIMULIA R&D Technical Director at Dassault Systèmes, specializing in advanced modeling of nonlinear RF devices using innovative measurement techniques. With over 20 years of experience in semiconductor measurement and modeling (Pulse IV, Load Pull…), he previously served as CEO of AMCAD Engineering. Tony holds a PhD from XLIM Lab (University of Limoges) and an Executive Master in Digital Marketing from HEC Paris.

Portrait image of Giancarlo De Chirico

Giancarlo De Chirico, Director of Strategic Partnerships Probe Systems Business, FormFactor

Giancarlo De Chirico is the Director of Strategic Partnerships in the Probe Systems Business Unit at FormFactor. He has 14 years of experience in network analysis and characterization of RF, microwave, and mm-wave devices. He has hosted numerous seminars and workshops on component characterization techniques. Before joining FormFactor in 2022, Giancarlo served as a Director at Keysight Technologies and was responsible for the growth of the Aerospace & Defense Device/Component Test and Military ATE industries. He holds a Master's Degree in Electronics Engineering from Politecnico di Milano (Italy) and a Bachelor's in Electronics Engineering from Politecnico di Bari (Italy).

Portrait image of Gavin Fisher

Gavin Fisher, Applications Specialist, FormFactor

Gavin Fisher is an applications specialist at FormFactor’s centre of expertise with responsibility for the RF applications. He provides application support and technical services to customers, in addition to evaluating and assisting in product development. With more than two decades of experience in Cascade / Formfactor probe systems, he has a broad spectrum of application knowledge in high-frequency measurement, calibration, automation and power device measurement. He educates and trains customers on best practices to achieve accurate measurement results. He has made several presentations at European Microwave Week, International Microwave Symposium, and MOS-AK workshops. Prior to joining Formfactor, he served at Alenia Marconi Systems in the radar systems division.

Portrait image of Mehrdad Harifi-Mood

Mehrdad Harifi-Mood, RF Engineer, Focus Microwaves

Mehrdad Harifi-Mood received the B.Sc. degree in electrical engineering–electronics and the M.Sc. degree in electronics–IC design from the University of Birjand, Iran, in 2017 and 2020, respectively, and the Ph.D. degree in telecommunications from the Institut national de la recherche scientifique (INRS), Université du Québec, Montreal, Canada, in 2025. His doctoral research focused on the design of integrated circuits for noise measurement applications, with emphasis on linearity, reliability, and performance at mm-wave frequencies for laboratory measurement systems. He is currently with Focus Microwaves, Montreal, Canada, where he is a member of the RF engineering team, working on noise measurement techniques and the development of advanced noise measurement systems.

Partners

FormFactor logo

FormFactor

Focus Microwaves logo

Focus Microwaves

Dassault Systemes logo

Dassault Systemes