Oscilloscopes Application Videos - Media Center

Power Integrity - Precise measurements with the R&S®RTE1000 Oscilloscope and the R&S®RT-ZPR20 Power Rail Probe

The quality of the power supply is a key factor in the functionality and performance of electronic circuits. Disturbance signals on the DC power supply network can lead to EMC problems or impair the functioning of a circuit. To assess the quality of the power supply, Rohde & Schwarz offers the R&S^®RT-ZPR20 power rail probe. It is designed for precise power integrity measurements with the R&S^®RTE1000 and R&S^®RTO2000 oscilloscopes.

Power Integrity - 5 tips on how to make more precise measurements

Making accurate power integrity measurements continues to increase in importance as rail voltages get lower and tolerance get tighter. Most important for precise results is a low noise oscilloscope and the right probe. This video demonstrates how to obtain the best results using the R&S^®RTE1000 oscilloscope and the R&S^®RT-ZPR20 power rail probe.

EMI Debugging

Meeting EMI and EMC requirements is critical to bringing electronic products to market. Compliance testing requires expensive equipment and test time at a compliance laboratory. Failures found late impact project costs and launch schedule due to debugging and re-testing. This video shows how the R&S^®RTO oscilloscope can be used with a near field probe to find and fix EMI issues quickly and reliably during the development at the R&D lab thereby minimizing expensive re-testing and shortening time to market.

Testing Conducted Emission in the R&D lab

Conducted emissions are electromagnetic disturbances caused by a device and conducted out by interconnects such as the power supply lines. Devices are required to pass stringent limits on the level of such emissions and these tests require expensive testing time at compliance laboratories. This video shows how the powerful spectrum analysis features in the R&S^®RTO oscilloscope can be used to verify conducted emission levels relative to the requirements during development thereby ensuring passing results in the compliance laboratory.

Capturing of intermittent RF signals with the Zone Trigger

Zone Triggering typically allows to define a trigger condition based on an area of voltage and time. The R&S^®RTO oscilloscope features a very powerful extension and offers Zone Triggering also in the Frequency domain. This is useful for triggering for example on EMI interferences or other frequency domain effects. This video demonstrates this unique capability of the R&S^®RTO on the example of a frequency hopping signal.

Analysis of wideband Pulse Signals

This video shows how the R&S^®RTO oscilloscope with its vector signal explorer (VSE) software can be used to analyze wide band pulsed RF signals in terms of frequency, phase, amplitude and timing.

Measurement of very small currents

Measuring small currents has become increasingly important for battery powered portable and wearable consumer devices, IoT and medical applications. Designers of these devices must measure currents from the sub-milliampere up to the ampere range. The R&S^®RTE and R&S^®RTO oscilloscopes can measure currents down to 100 uA using their low noise and high-sensitivity current probe.

Power Integrity Test

Today’s highly integrated electronic devices use smaller voltage levels and, as a result, require much smaller ripple levels on the power rails for reliable operation. The challenge is in being able to measure very small mV level signals riding on 1 to 3 V power rails accurately. This video addresses this measurement using the R&S^®RTE oscilloscope with its low noise front end and fast update rate which allows quick and accurate measurements of peak to peak ripple voltages. With the spectrum view even more insides in the signal are possible.

eMMC Interfaces Compliance Test

Embedded multi-media cards (eMMC) are widely used in the industry as the primary memory for portable devices. The R&S^®RTO-K92 eMMC Compliance Test option offers an automated test solution for the electrical interface of an eMMC device according to the JEDEC specification, revision 5.1.

MIPI D-PHY Compliance Test

This video shows the R&S^®RTO-K26 MIPI D-PHY compliance test options which provides automated testing to the MIPI D-PHY standard for camera and display interfaces.

Evaluating the performance of RF assemblies controlled by a MIPI-RFFE interface

This video demonstrates how the R&S^®RTO-K40 option can be used to measure response times of front end components such as power amplifiers (PA) and switches controlled by the MIPI RFFE control interface.

SpaceWire Triggering & Decoding

SpaceWire is a new serial bus standard for aircraft and areospace applications that supports bit rate up to 400 Mbps. The Rohde & Schwarz option K65, SpaceWire trigger & decode, for R&S^®RTE and R&S^®RTO offers triggering and decoding of SpaceWire protocol communication.

Multi-domain Debugging of embedded IoT Devices

Internet of Things (IoT) devices combine multiple functional cores in highly integrated wireless embedded designs and face often challenging long-term battery live time requirement. This video demonstrates on an example M2M IoT device the Multi-domain test capabilities of the R&S^®RTO oscilloscope.

Oscilloscopes for Accelerator physics

In accelerator physics, pulsed signals frequently need to be measured. The digital trigger and low noise frontend of the R&S^®RTO digital oscilloscope make it possible to perform the high precision measurements needed to characterize the experimental setup. Several measurement functions specially developed for accelerator physics labs support detailed signal analysis.

Webinar: Automotive Ethernet Compliance Testing

With the introduction of Ethernet in cars, a new class of interface quality tests is required. The OPEN alliance has released a test specification for BroadR-Reach Ethernet. The compliance test focuses similar to most Ethernet compliance test specifications of the IEEE on transmitter quality. In this webinar, details will be provided on the individual test cases of the compliance test as well as hints on the required test setup.

Eye diagram measurement with the hardware clock data recovery of the R&S®RTO digital oscilloscope

Serial high-speed data interfaces such as USB 2.0, LVDS, HDMI or PCI-e require a special approach for jitter measurements as they use an embedded clock signal as time reference. Clock data recovery is required to extract the frequency and phase information of the embedded clock out of the data signal. The R&S^®RTO digital oscilloscope with option R&S^®RTO-K13 performs clock data recovery in hardware and real-time. This enables triggering on the embedded clock as well as fast histogram and eye mask testing on high-speed serial data signals with embedded clock.

Jitter measurements with the jitter wizard of the R&S®RTO digital oscilloscope

Jitter measurements are required for characterization and debugging of fast clock and data signals. This is commonly referred to as "signal integrity" testing. Clock signals and data signals as part of parallel and serial interfaces are widespread in almost any electronic design. The jitter wizard of the R&S^®RTO digital oscilloscope guides the user step-by-step through the configuration of the oscilloscope to perform common jitter measurements such as period and frequency, TIE, cycle-to-cycle jitter, and skew.

Frequency Analysis in the R&S®RTO Oscilloscopes - part 1 of 3

"Get to know more about the frequency analysis with the R&S^®RTO oscilloscopes from Rohde & Schwarz in this video series: their unique implementation and all the flexibility they can offer you when combined with the time analysis, serial bus decoding, mask testing and the history mode. Part 1 explains how the oscilloscope keeps its fast acquisition rate and performs multiple FFT processes in every acquisition."

Frequency Analysis in the R&S®RTO Oscilloscopes - part 2 of 3

Get to know more about the frequency analysis with the R&S^®RTO oscilloscopes from Rohde & Schwarz in this video series: their unique implementation and all the flexibility they can offer you when combined with the time analysis, serial bus decoding, mask testing and the history mode. Part 2 shows the easy configuration of the frequency analysis and mask testing for the analysis of AM and FM modulated signals.

Frequency Analysis in the R&S®RTO Oscilloscopes - part 3 of 3

Get to know more about the frequency analysis with the R&S^®RTO oscilloscopes from Rohde & Schwarz in this video series: their unique implementation and all the flexibility they can offer you when combined with the time analysis, serial bus decoding, mask testing and the history mode. Part 3 demonstrates a detailed frequency analysis with multiple gates in parallel to SPI bus decoding and time-domain analysis of signals of a VCO board.

RF measurements for near field communication (NFC) with Rohde & Schwarz oscilloscopes

Measurements - in listening and polling mode - on NFC devices, according to the NFC Forum with a simple, fast, easy to use and accurate test solution from Rohde & Schwarz.The setup involves:

• R&S^®RTO oscilloscope to acquire the waveforms from the DUT
• R&S^®SMBV100A signal generator to provide the NFC-compliant signals
• R&S^®RTO-K11 IQ software interface to demodulate the carrier and provide NFC specific triggers
• R&S^®FS-K112 NFC software to perform the analysis in line with the NFC standard

Testing ADCs in embedded systems with Rohde & Schwarz oscilloscopes

"The complexity of embedded designs that include ADCs represents challenges in testing. Is the signal performance at the ADC input and output correct? How to detect skew issues? How to measure the reaction time between the programming interface and the ADC? Discover the easiest way to test and debug ADCs using the R&S^®RTO oscilloscope:

• Highest dynamic range of the analog channels
• 16 MSO channels with 5 GSa/s
• Triggering and decoding on serial buses
• Smartest GUI: Rohde & Schwarz SmartGrid.

USB 2.0 Compliance Test Solution

The new R&S^® USB 2.0 Compliance Test software is an automated test solution according to the USB-IF test specification to address the testing of USB Device, Host and Hub applications at the various speed modes High-speed (USB specification 2.0: 480 Mbps), Full-speed (USB 1.1: 12 Mbps) and Low-speed (USB 1.0: 1.5 Mbps).

Rohde & Schwarz at EuMW 2012: Up to 4 LTE MIMO antenna signal analysis with one oscilloscope

Rohde & Schwarz demonstrated 2x2 LTE MIMO transmitter signal analysis with one R&S^®RTO digital oscilloscopes at the European Microwave Week 2012. An R&S^®RTO with four channels acquires up to four LTE MIMO antenna signals simultaneously. Equipped with the R&S^®RTO-K11 I/Q software interface option, the R&S^®RTO provides the I/Q data of the acquired signals to the external R&S^®FS-K10xPC LTE analysis software for demodulation and detailed analysis.

Rohde & Schwarz at MWC 2013: LTE-Advanced 2x2 MIMO testing in UL and DL

Rohde & Schwarz demonstrated the most compact solution for LTE-Advanced 2x2 MIMO testing at the GSMA Mobile World Congress 2013 in Barcelona. The R&S^®SMU200A vector signal generator simulates a 2x2 MIMO uplink signal with fading for receiver testing. An LTE-Advanced 2x2 MIMO downlink signal, generated by a small cell, is captured and processed by one R&S^®RTO digital oscilloscope. The R&S^®FS-K10xPC LTE analysis software enables detailed analysis of the received signal.

Rohde & Schwarz at MWC 2014: LTE-Advanced MIMO testing

Rohde & Schwarz showcased a compact LTE 4x4 MIMO test solution at the GSMA Mobile World Congress 2014 in Barcelona. Based on the new high-performance R&S^®SMW200A vector signal generator and the R&S^®RTO digital oscilloscope, the solution provides MIMO signal generation and realtime channel emulation (up to 4x4 or 8x2) as well as synchronous analysis of multiple TX antenna signals. This setup is also the basis for 2x8 LTE base station receiver testing.