LTE / LTE-Advanced

LTE Terminal Tests under Fading Conditions with R&S®CMW500 and R&S®AMU200A

This application note shows how to perform LTE terminal block error rate (BLER) and throughput tests under fading conditions with the R&S®CMW500 Protocol Tester and the R&S®AMU200A Fading Simulator.

Name
Type
Version
Date
Size
LTE Terminal Tests under Fading Conditions with R&S®CMW500 and R&S®AMU200A | 1MA177
Type
Application Note
Version
4e
Date
06-Jun-2011
Size
1 MB
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