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9 Results
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A key challenge for embedded devices with DDR memories is to maintain signal integrity in the presence of power and ground rail fluctuations. This becomes even more important as supply voltages decrease and switching speed increases leading to tighter power rail tolerances and jitter requirements.
English - Apr 5, 2017
Describes the probe to 3.
English - Feb 20, 2022
Describes the probe and its usage.
English - Feb 22, 2023
English - Oct 9, 2019
765 kB | PDF
Increasing demands on power distribution networks have resulted in smaller DC rails, as well as a proliferation of rails that ensure clean power reaches the pins of integrated circuits.
English - Mar 7, 2017
Provides information on security issues when working with R&S®RT-Z in secure areas.
English - Oct 27, 2022
Describes the probe interface extender and its usage.
High bandwidth probes for R&S®RTM3000, R&S®RTA4000, R&S®MXO 4, R&S®RTE, R&S®RTO6, R&S®RTP oscilloscopes
English - Sep 27, 2022
941 kB | PDF
Oscilloscope test applications include debugging complex electronic circuits, measuring high-speed-bus signal integrity and characterizing power electronics with hazardous voltage levels. Measurement accuracy and operator safety depend on these probes and accessories.
English - Dec 18, 2025
13 MB | PDF
