This document provides the technical specifications of the R&S®FSW3-KM125/-KM126, R&S®Fxx-K30 noise figure measurement application.

This document provides the technical specifications of the R&S®FSW3-KM129/-K130 and R&S®Fxx-K40 options.

This document provides the technical specifications of the R&S®FSW3-KM101/-102/-103/FSx-K70/-K70M/-K70P/VSE-K70/-K70M/-K70P vector signal analysis application.

This document provides the technical specifications of the R&S®FSW3-KM320/-KM321/-KM324/-KM326/-KM327/-KM331/-KM335, R&S®FSx-K144/-K145/-K147/-K147C/-K148/-K171/-K175/-K184 and R&S®VSE-K144/-144X/-K146/-K148/-K171/-K175/-184.

This document provides the technical specifications of the R&S®FSW3-KM118/-KM119/-KM120/-KM121, R&S®Fxx-K18(F/D/M), R&S®VSE-K18(F/D/M) options.

Class-leading mobile network infrastructure testing solutions to address various needs and to enable the opportunities of 5G. Learn more.

This document provides the technical specifications of the R&S®FSW3-KM107/R&S®Fxx-K7/ESW-K7/VSE-K7/RTO AM/FM/PM modulation analysis option.

06-Nov-2025 | Press Releases | Test & measurement

As trusted partner for electronics manufacturing, Rohde & Schwarz present its latest innovations at productronica 2025, designed to help manufacturers streamline production processes.

Explore solutions for electronic spectrum operations (EMSO) and electromagnetic warfare testing. Discover products for EW testing, radar testing and cognitive radar.

A low EVM is key to meeting the demand for higher data rates. Explore EVM validation solutions. Discover the cutting edge of RF component characterization.

03-Jun-2025 | Press Releases

At the International Microwave Symposium IMS 2025 in San Francisco, Rohde & Schwarz will highlight its newest test instrument that will enable RF engineers to discover signals once out of reach. In addition, updates for the tried and tested R&S FSWP phase noise analyzer as well as the latest vector network analyzer R&S ZNB3000 will be on display. With the IMS workflow passport challenge, the company organizes a fun way to experience RF design workflows across multiple show booths.

Learn all about DANL! The displayed average noise level is shown on a spectrum analyzer when the input is terminated with a matched load.

Spectrum analyzer dynamic range indicates ability to simultaneously measure high- and low-level signals. Learn about dynamic range and dynamic range measurements!

ACLR is a key measurement for devices or systems that use wideband, digitally modulated signals. Learn more about ACLR and how to measure it with a spectrum analyzer.

Learn about distortion, harmonics and harmonic distortion measurement using spectrum analyzer! Expand your technical expertise.

Discover Noise Power Ratio (NPR) – a key metric for intermodulation distortion in multicarrier and satellite systems. Understand NPR easily.

Explore different methods for measuring phase noise with a spectrum analyzer! Learn about spectrum analyzer resolution bandwidth, noise marker and shape correction.

Learn all about spectrum analyzer noise measurement! A low noise figure is key for RF applications. Learn how to measure noise figure effectively.

Learn about error vector magnitude and best practices for how to calculate error vector magnitude! Understand EVM now