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  • Measuring RDS(on) with high-definition oscilloscopes

    RDS(on) of MOSFETs is a key parameter for determining the conduction loss in switched-mode power supply applications and is therefore of special interest. When a switching MOSFET is off, it has a high drain-to-source voltage, but when it is turned on the voltage drops to just a few hundred millivolts. A high-resolution oscilloscope is needed to measure these low voltages. Probe compensation and correct probing are also vital for accurate RDS(on) measurements.

  • Methods to obtain trusted RMS results on the R&S®RTM

    RMS is one of the most common parameters in test and measurement. Mathematically, it is the quadratic mean of continuously varying values (waveform). Especially when quantifying power, RMS simplifies the calculation as the polarity of the voltage and direction of the current can be disregarded.

  • Comparison of jitter measurements in the time and frequency domain

    When analyzing the robustness of data transmission systems, jitter is a key indicator. It is recommended to use jitter measurement instruments for both the time and frequency domain in order to differentiate between fast and slow moving artifacts.

  • Quick and efficient troubleshooting with the R&S®Scope Rider

    Signal faults and anomalies can cause electrical and electronic systems to fail. Especially in the field, these errors can lead to system downtimes and produce high costs. Consequently, finding them quickly and efficiently as well as identifying their source are crucial.

  • Optimizing wide-bandgap semiconductor switches to meet EMI compliance

    EMI compliance is becoming a major concern for advanced power electronics due to increasing switching speeds. Correlated time-frequency measurements help optimize gate driving and minimize electromagnetic emission already during development.

  • dB Calculator

    30 dBm + 30 dBm = 60 dBm? It is well known that it is not as easy as that.This application note supplies a free of charge software tool that can be used to add or subtract an arbitrary number of powers. In addition, the software can be used to convert power and voltage units from the linear to the logarithmic scale (and vice versa), convert linear power and voltage ratios to decibels, and convert a VSWR to other reflection quantities.

  • Dynamic re-referencing – microvolt-level measurements with the R&S®RTO oscilloscopes

    In order to clearly visualize and make repeatable measurements on signals with amplitudes of less than 1/100 of a division, and stabilize signals captured over very long periods, the R&S®RTO oscilloscope’s powerful combination of measurement and math channel capabilities allows corrective offset adjustments on individual acquisitions more than one hundred times per second.

  • Faster debugging using specialized triggers

    In addition to the generic edge trigger, modern oscilloscopes offer triggers that are specialized to address specific problems.

  • Benefits of R&S®RTO digital trigger system

    The trigger is a key element of an oscilloscope. It captures specific signal events for detailed analysis and provides a stable view on repeating waveforms. Since its invention in the 1940s the oscilloscope trigger has experienced continuous enhancements. The fully digital trigger of the R&S®RTO digital oscilloscopes sets an innovation milestone that brings significant advantages for the oscilloscope user in terms of measurement accuracy, acquisition density, and functionality. This application note introduces the working principles of a conventional trigger system and explains the advantages of the real-time capable digital trigger of the RTO oscilloscopes.

  • Jitter Analysis with the R&S®RTO Digital Oscilloscope

    This application note presents the Jitter analysis capabilities of the R&S®RTO for digital signals. It demonstrates the basic operation with an application example, and shows the associated jitter analysis.

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