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Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
Search Rohde-Schwarz.com
Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
161 Results
I have several traces with markers in one channel. When I query the result of marker 1 I always get the response of trace 1. How can I get the result of marker 1 for trace 2?
I have a file on my device. How can I get it in a simple way to my PC?
I query the values of a trace using scpi commands. But I get the y-values only. Is there a possibility to get the y-values also (frequency)?
How do I calculate these frequency points when I have a logarithmic sweep and know the center frequency, the span and the number of sweep points?
26-Mar-2024 | Press Release | Test & measurement
embedded world 2024: Rohde & Schwarz presents its cutting-edge test solutions for embedded systemsRohde & Schwarz offers comprehensive test and measurement solutions for embedded design challenges for today’s requirements for efficiency, safety, reliability and interoperability. The highlights will be showcased at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.
Rohde & Schwarz Technical Information for the R&S ZN-Z170/-Z135/-Z129/-Z129E calibration kits.
21-Mar-2022 | Press Release | Test & measurement
Rohde & Schwarz at DesignCon 2022 presents latest innovations for high-speed digital applicationsAt DesignCon 2022, Rohde & Schwarz will showcase live demos covering industry trends in cooperation with industry experts such as Samtec, ataitec, Clear Signal Solutions, and more.
Solve complex test & measurement challenges with innovative solutions from Rohde & Schwarz. Our industry-leading T&M equipment never compromises on quality & precision.
Choose Rohde & Schwarz signal and power integrity test solutions for the best application fit thanks to time and frequency considerations.
Choose Rohde & Schwarz test solutions for power amplifier efficiency optimization for their dual path signal generation capabilities and ease of results analysis.
Explore RIS with Rohde & Schwarz as one of the most promising key technologies in the future 6G era!
ZNA, Average Pulse Measurements Making pulsed measurements with a vector network analyzer
23-May-2023 | Press Release | Electronic design
Rohde & Schwarz to host RF Design Challenge at IMS2023At IMS2023, Rohde & Schwarz is set to exhibit a range of live demos that showcase the cutting-edge developments within the industry. IMS attendees will also have the opportunity to participate in the interactive "Are you a genius?" RF Design challenge, putting their knowledge to the test at the Rohde & Schwarz booth.
Welcome to Rohde & Schwarz webinar VNA: Noise Figure Measurements.
ZNA, Point-In-Pulse Measurements Making pulsed measurements with a vector network analyzer
ZNA, vector network analyzer Making pulsed measurements with a vector network analyzer
Learn about different aspects of load pull analysis and testing. Discover a load pull measurement setup from an industry leader in load pull testing. Explore now.
Discover solutions for on-wafer testing, die testing and RF probing. Explore wafer testing equipment, such as vector network analyzers and probe stations.
This webinar contains the basic and novel methods for the characterization of mixers with VNAs.
More: https://www.rohde-schwarz.com/wireless/B5G ThinkSix, B5G, beyond 5G, 6G, sub-terahertz, ATS1000, ZNA, D-Band This video demonstrates the R&S®ATS1000 antenna test system from Rohde & Schwarz, now supporting frequencies up to 170 GHz.
Overview of Rohde & Schwarz TRM and antenna testing. Explanation of all application fields.
Overview of Rohde & Schwarz TRM and antenna testing. Explanation of all application fields.
Listing of all video overview pages sorted by categories and themes. Looking for additional insight on a specific application or measurement technique? Pick your topic of interest.
04-Aug-2021 | Press Release | Test & measurement
Rohde & Schwarz demonstrates the all-new R&S RTO6 oscilloscope at DesignCon 2021Silicon Valley’s premier event for chip, board, and systems design engineers – DesignCon – returns in 2021 to San Jose, CA. Rohde & Schwarz, industry-leading T&M specialist, will be an exhibitor in person this year with its extensive and innovative product and solutions portfolio. As this year’s highlight, Rohde & Schwarz will be demonstrating live the all-new R&S RTO6 oscilloscope.
25-Oct-2022 | Press Release | Test & measurement
Rohde & Schwarz announces RF Lumination seminar tour to take place in EuropeThe upcoming educational RF Lumination seminar series from Rohde & Schwarz shines a light on typical applications in the RF and microwave industry. In multiple events across Europe, participants can find out more about vector network analysis or learn about applications such as load-pull measurements or power amplifier characterization.
25-Sep-2020 | Press Release | Test & measurement for ADS
Rohde & Schwarz offers portfolio for precise AESA testingRohde & Schwarz offers new test and measurement solutions for TRM performance validation, enabling the customer to maximize their radar system capabilities.
18-Jan-2023 | Press Release
Rohde & Schwarz to host Digital Debug Design challenge at DesignCon 2023At DesignCon 2023, Rohde & Schwarz will not only showcase live demos covering the latest industry trends, attendees will also be able to test their knowledge at the interactive Rohde & Schwarz “Are you a genius?” Digital Debug Design challenge. Plus, Rohde & Schwarz will offer a full-day workshop in cooperation with industry experts such as Samtec, ataitec, Clear Signal Solutions, and Missouri University of Science & Technology.
A wide range of Signal Integrity solutions from Rohde & Schwarz ► Get more information!
Come and join us at this years European Microwave Central Europe 2019 trade show to get insights in RF and component testing, A&D, radar and 5G NR test and measurement solutions from Rohde & Schwarz
Where history meets tomorrow - Vector Network Analyzer - Flyer Brochures and Data Sheets Flyer