EMI debugging
EMI debugging

Electromagnetic interference (EMI) debugging

When debugging electromagnetic interference (EMI) problems, electronic design engineers face the challenge of identifying the sources of unwanted emissions and developing a solution for them. Repetitive testing at the EMC compliance laboratory to identify and resolve these problems is costly and often significantly delays the product launch. Frequent EMI testing throughout the complete development process reduces the probability of a major redesign, effectively decreasing product launch costs and delays.

Digital oscilloscopes in combination with near-field probe sets are powerful instruments for debugging during design. They allow designers to quickly locate and analyze EMI problems early on. High dynamic range and a high input sensitivity of 1 mV/div ensure that even weak emissions can be analyzed. The R&S®RTO fast Fourier transformation (FFT) implementation provides a fast update rate and the FFT frame overlay processing and persistence display provides insights into the structure of unwanted emissions.

x̂Rohde & Schwarz offers a range of instruments featuring dedicated test modes such as spectrum analyzer mode (combined with zero span), realtime measurement persistence mode and spectrogram view. For EMI test procedures, a stepped scan receiver mode (classic mode) and a time domain (FFT-based) receiver mode are available. While the stepped scan mode offers point-by-point coverage of the complete spectrum, the time domain mode allows parallel handling of numerous frequency points.

Find more details in our application brochure "Driving tomorrow's mobility".

Emissions captured by an oscilloscope using a near-field probe.

DUT timing behavior via the spectrogram view.

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