High-Speed Digital Test webinars

Webinar: Selection, characterization and de-embedding of differential probes for accurate measurements of high-speed PCB signal structures

This webinar addresses the key aspects for making accurate measurements with differential probes on high-speed PCB signal structures: The selection of the right probe and the characterization of this probe, so that it can be completely de-embedded from the measurement result. This also includes the discontinuity at the contact area between probe tips and measured PCB structure. It is caused by the probing and is not part of the PCB structure. For accurate results, this discontinuity also needs to be characterized and removed from the measurement results. In this webinar, we demonstrate the measurements and compare the results, when just de-embedding to the probe tips and when correctly also removing this discontinuity.

We will start with some typical use cases for measurements with differential probes, introduce the concept of test fixture characterization and de-embedding and the particular challenges and solutions for accurate measurements with differential probes. We also discuss the specifics of differential probes and their advantages. By reference to practical measurements of a differential trace on a test board we will explain the steps required to obtain best measurement results.