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Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
Search Rohde-Schwarz.com
Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
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R&S®MXO 4 系列新一代示波器性能出色,性價比高。儀器實現跨代工程技術突破,可以提供快速的洞察與分析。
R&S®MXO 4 — это первая серия в новом поколении осциллографов с превосходными характеристиками и высокой эффективностью. Данные приборы символизируют собой уникальный технологический прорыв, благодаря которому удалось достичь огромного быстродействия.
The R&S®MXO 4 Series is the first of a new generation of oscilloscopes that excels in both performance and value. The instruments deliver a once-in-a-decade engineering breakthrough for accelerated insight.
R&S®MXO 4シリーズは、性能と価値の両面に優れた初の新世代オシロスコープです。このシリーズのオシロスコープは、10年に一度とも言われる画期的な技術革新によって、深い洞察がすばやく得られる高速な解析速度実現しています。
Explore an engineer’s toolbox with our comprehensive list of electronic test equipment. Learn about the instruments that define modern electronics testing.
La série R&S®MXO 4 est la première d'une nouvelle génération d'oscilloscopes qui excelle à la fois en termes de performance et de capacité. Dix années de recherche ont permis cette rupture technologique pour une vision démultipliée.
Die R&S®MXO 4 Serie läutet eine neue Generation von Oszilloskopen ein, die höchste Performance mit einem hervorragenden Preis/Leistungsverhältnis verbindet. Die Geräte stellen einen entscheidenden technologischen Durchbruch dar, der die Analyse Ihrer Messobjekte erheblich beschleunigt.
La serie R&S®MXO 4 es la primera de una nueva generación de osciloscopios que destaca tanto por su rendimiento como por su rentabilidad. Esta gama representa un avance que marca toda una década y permite obtener análisis exhaustivos al instante.
R&S®MXO 4 Series Oscilloscope - Specifications Brochures and Data Sheets Specifications
R&S®MXO 4 Oscilloscope versus Lecroy WaveSurfer 4000HD - Comparison Sheet Brochures and Data Sheets
R&S®MXO 4 Oscilloscope versus Keysight 4000 X-series - Comparison Sheet Brochures and Data Sheets
Measure and analyze control loop stability with our solutions by Rohde & Schwarz., Get to know our control loop analysis tools!
31-Oct-2023 | Press Release | Test & measurement
Evolved for more challenges: Rohde & Schwarz adds eight-channel R&S MXO 5 to next-generation oscilloscopesRohde & Schwarz presents the new R&S MXO 5 oscilloscopes, its first with eight channels. It takes measurement performance to the next level.
R&S®RT-Zxx High Voltage and Current Probes - Specifications Brochures and Data Sheets Specifications
12-Oct-2022 | Press Release | Test & measurement
Rohde & Schwarz empowers launch of 4D imaging radar platform by automotive radar manufacturer Cubtek in partnership with NXPCubtek Inc. is using network analyzers from Rohde & Schwarz in the development of 4D imaging radar for RF measurement of the E-band. Rohde & Schwarz oscilloscopes and their independently developed, application-specific integrated circuits (ASIC) provide the best measurement tools for automotive radar research and development.
R&S®RT-Zxx Oscilloscope Adapters - Specifications
14-Aug-2023 | Press Release | Test & measurement
Rohde & Schwarz sponsors HORYZN and LEVITUM student initiatives with test equipment for drone developmentAs a gold sponsor, Rohde & Schwarz provides test equipment to the HORYZN and LEVITUM student initiatives of the Technical University of Munich (TUM) to help with drone development. The students at TUM are working hard to develop, build and test vertical takeoff and landing drones for various applications.
27-May-2024 | Press Release | Test & measurement
Rohde & Schwarz presents its solutions for next generation wide bandgap device test and debug at PCIM EuropeRohde & Schwarz will showcase its latest solutions for power electronics testing at PCIM Europe in Nuremberg, addressing challenges of testing and debugging the next generation of wide bandgap semiconductors in power electronic converters.
11-Jun-2024 | Press Release | Test & measurement
Rohde & Schwarz presents R&S RT-ZISO isolated probing system for precise measurements of fast switching signalsRohde & Schwarz has developed the R&S RT-ZISO isolated probing system for extremely accurate measurements of fast switching signals, especially in environments with high common-mode voltages and currents.
R&S RT-Zxx Standard Probes - Specifications
Oscilloscope innovation. Measurement confidence. - Flyer Brochures and Data Sheets Flyer
07-Nov-2023 | Press Release | Test & measurement
When innovation meets production – Rohde & Schwarz exhibits at productronica 2023Innovation and production – hand in hand. The Rohde & Schwarz motto for this year’s productronica, where the company will present itself as a reliable partner for electronics manufacturing needs. Visit us at booth A1/375.
26-Mar-2024 | Press Release | Test & measurement
embedded world 2024: Rohde & Schwarz presents its cutting-edge test solutions for embedded systemsRohde & Schwarz offers comprehensive test and measurement solutions for embedded design challenges for today’s requirements for efficiency, safety, reliability and interoperability. The highlights will be showcased at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.
Selecting your next oscilloscope: Why fast update rate matters | 选择下一代示波器: 为什么更高的波形捕获率很重要 - White Paper Brochures and Data Sheets White Paper
This document provides: - An explanation of update rate - How users can quickly perform their own update rate characterization - How to compare vendor update rates - Benefits of fast update rate
This document provides: - An explanation of analog versus digital triggering architectures - User advantages for oscilloscopes that have digital triggering - How to determine if an oscilloscope has a digital or analog trigger
本白皮书包含以下内容:- 模拟和数字触发架构 - 数字触发示波器的优势 - 如何辨别数字或模拟触发示波器
This guide covers the most important aspects of selecting an oscilloscope and provides you with the knowledge to make the best choice for your needs.
This document provides: - A description of how oscilloscope acquisition memory is defined - Insight into the relationship between memory and other oscilloscope parameters - Examples where deep memory provides value