Key facts
- Four configurable SW-CDRs. Additional 8/16 Gbps HW-CDR on RTP oscilloscope
- Up to four eye diagrams
- Advanced set of automated eye measurements
- Comprehensive mask library
- PAM signal support
Key facts
The R&S®MXO5/RTO6-K136 and the R&S®RTP-K136/137 options enable eye analysis of data signals, one of the most powerful signal integrity measurement tools. A SW-CDR (clock data recovery) is used to bit slice the acquired data stream for detailed eye parameter analysis. On the RTP, a continuously running hardware-based CDR supports additionally live eye analysis for long-term fault analysis. Standard tools such as mask tests, histogram tests or automated eye measurements can be applied to the eye diagram. The powerful eye stripe function helps trace mask test failures in the acquired waveform.
Configurable 8 or 16 Gbps hardware CDR for continuous live eye analysis on RTP
The R&S®RTP has an unique hardware-implemented clock data recovery (HW-CDR) to bit slice serial data streams with an embedded clock. You can configure the nominal bit rate (between 21 kbps and 16 Gbps), as well as the tracking bandwidth or relative bandwidth. The hardware CDR in the R&S®RTP continuously follows the drift of the input signal. The HW-CDR supports also PAM signals up to PAM8. For eye diagram analysis of a longer acquisition, up 4 SW-CDRs can be configured with every RTP/RTO6/MXO Advanced Eye options.
Setup dialog for the configurable HW-CDR
The configurable hardware clock data recovery in the R&S®RTP supports PAM signals and data rates of up to 16 Gbps for data eye analysis.
Advanced set of automated eye measurements
Automated measurements make advanced eye analysis easy to use. Select eye measurement from 15 measurement categories and use all standard analysis functions such as statistics, track, histogram and trend display.
Automated eye measurements
Select from an advanced set of automated eye measurements
Comprehensive mask library
The histogram and the mask test functions can be used for further analysis. A comprehensive mask library is also available for the eye diagram. Select a predefined mask for dedicated standards such as USB, PCI Express or Automotive interfaces.
Trace back mask test failures
Use the eye stripe function to identify mask test failures in the original acquired waveform. The mask test failure list helps navigate the zoom window to where the waveform that violated the mask. This makes it easier to understand the root cause of signal integrity issues.
Eye stripe function
Trace back mask test failures in the acquired waveform via the EyeStripe function and Zoom coupling
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