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OTA Wireless Coexistence Testing Products and Solutions for Consumer Electronics, Medical and Automotive
Presented by Naseef Mahmud, Rohde & Schwarz
VNA: Signal Integrity and Deembedding
Presented by Jörn Pfeifer, Rohde & Schwarz
Riding the Next IoT Wave Enabled by 5G (Rel.16/17)
Presented by Jörg Köpp, Rohde & Schwarz
Phase Noise and Advanced Jitter Measurements Part 1
Presented by Oliver Voss and Alexander Küllmer, Rohde & Schwarz
Basic Introduction to the new R&S®ELEKTRA test software, the Successor of the famous R&S®EMC32 Measurement Software
Presented by Martin Randrup Villadsen, Rohde & Schwarz
Phasenoise and Advanced Jitter Measurements Part 2
How are SI, PI and EMI Related to Each Other
Duration: 1 hour Language: EN
VNA: Pulse Measurements and Analysis
Presented by Jamie Lunn, Rohde & Schwarz
Which Probe to Choose for Digital and High-Voltage Applications
Presented by Alexander Küllmer and Pasi Suhonen, Application Engineers
Bode Plot Measurements with Oscilloscopes
Presented by Kenneth Rasmussen, Rohde & Schwarz
OTA Fundamentals and Rohde & Schwarz Solutions
RF Connector Care and Good Practices
Presented by Jamie Lunn, Rohde & Schwarz UK Ltd
CMsquares Sequencer - ONE Graphical Scripting Tool for All Your Automated 5G Testing Needs
Automotive Ethernet Measurements
Presented by Alexander Kuellmer - Application Engineer Digital Debug Tools
Oscilloscope Fundamentals
