Jitter analysis oscilloscope software

General analysis

Jitter Analysis
Open Lightbox
Jitter Analysis
Open Lightbox
Jitter Analysis Jitter Analysis

Key facts

  • Automatic jitter measurements
  • Jitter wizard for easy configuration of jitter measurements
  • Display of measurement results as track, long-term trend or histogram
  • Unique FFT on track for detailed analysis
  • R&S oscilloscopes | 3 years warranty extension

Oscilloscope software

The R&S®RTO-K12 jitter analysis option extends the functionality of the standard R&S®RTO firmware with a suite of measurement, analysis and visualization tools for signal integrity analysis and jitter characterization. The powerful Jitter analysis includes simple setup via Jitter-Wizard.

Features & benefits

Precise results

R&S®RTO oscilloscopes are ideally suited for jitter measurements. The sensitive, broadband, low-noise frontend combined with the high-precision, single-core A/D converter ensures exact results. Another strength of R&S®RTO oscilloscopes is their wide range of analysis options. For example, FFT analysis of the track for the cycle-cycle jitter lets you determine interference frequencies.

Open Lightbox

Precise results

Wizard for easy measurement configuration

Jitter wizard for easy configuration of jitter measurements

All automatic jitter measurements are combined into a single group. Use the jitter wizard to configure typical measurements in just seconds. You decide how the results will be displayed, e.g. as a histogram.

Open Lightbox

Wizard for easy configuration of measurements

Powerful analysis options

R&S®RTO oscilloscopes simplify detailed investigation of signals by providing a variety of graphical display options. The following displays and analysis options are available:

  • Long term trend
  • Track
  • Histogram
  • FFT on track
Open Lightbox

Unique FFT on track for detailed analysis

The features allows to perfrorm a FFT analysis on the track curve of a measurement result. Additional measurement quantities such as the frequency of interference sources through jitter analysis can be derived.

Open Lightbox

Available models

Oscilloscope portfolio


More information

Oscilloscope software

More information

Oscilloscope probes

More information

Request information

Do you have questions or need additional information? Simply fill out this form and we will get right back to you.

I want to receive information from Rohde & Schwarz via

Marketing permission

What does this mean in detail?

I agree that Rohde & Schwarz GmbH & Co. KG and the Rohde & Schwarz entity or subsidiary company mentioned in the imprint of this website, may contact me via the chosen channel (email or postal mail) for marketing and advertising purposes (e.g. information on special offers and discount promotions) related to, but not limited to, products and solutions in the fields of test and measurement, secure communications, monitoring and network testing, broadcast and media, and cybersecurity.

Your rights

This declaration of consent may be withdrawn at any time by sending an email with the subject "Unsubscribe" to news@rohde-schwarz.com. Additionally, a link to unsubscribe from future email advertisements is contained in each email sent. Further details on the use of personal data and the withdrawal procedure are set out in the Statement of Privacy.

Your request has been sent successfully. We will contact you shortly.
An error is occurred, please try it again later.
General and legal information