14 Results
Rohde&Schwarz Instrument Security - Overview of Covered Instruments
Rohde & Schwarz Instrument Security Procedures - overview of covered instruments.
R&S®FS-SNS26/40/55 Smart Noise Source Manual
Rohde & Schwarz manual for measurement setup with a R&S®FS-SNS26/40/55 Smart Noise Source.
R&S®FS-SNS26/40/55 Smart Noise Source Instrument Security Procedures
Rohde & Schwarz instrument security procedures for R&S®FS-SNS26/40/55 Smart Noise Sources.
Characterization of an amplifier with the combination of network and spectrum analysis
The general characterization of complex DUTs such as amplifiers requires the measurement of several parameters. Some may require more than one test device or expensive equipment. Thanks to its versatility, the R&S®ZNL is an economic solution that can characterize a variety of DUTs both via network analysis and spectrum analysis.
17-Dec-2021
R&S®FSV3000 Signal and Spectrum Analyzer - Product Brochure
R&S FSV3000 Signal and Spectrum Analyzer - Product Brochure
Noise figure and gain measurements on an amplifier
The R&S®FS-SNS smart noise sources simplify measurements and uncertainty calculation by automatically uploading the required correction tables and environmental temperature to the spectrum analyzer. video, spectrum analyzer, amplifier, noise figure, gain, y-factor method, FSV3-K30 This video shows how to measure the noise figure and gain measurements of an amplifier under test using a noise source.
R&S®FSVA3000 Signal and Spectrum Analyzer - Product Brochure
R&S FSVA3000 Signal and Spectrum Analyzer - Product Brochure
29-Aug-2019
Rohde & Schwarz brings its top-end microwave test solutions to EuMW 2019 on the SeineEurope's premier microwave, RF, wireless and radar event – European Microwave Week – returns to Paris in 2019. Rohde & Schwarz, an industry-leading T&M specialist, will be present with its extensive and innovative product and solutions portfolio, addressing various applications in the areas of RF and microwave component testing, over-the-air antenna characterization and conformance testing.
R&S®Fxx-K30 Noise Figure Measurement Application – R&S®FSW-K30, R&S®FSWP-K30, R&S®FSMR3-K30, R&S®FSV3-K30, R&S®FPS-K30, R&S®FSV-K30, R&S®FPL1-K30 - Specifications
R&S®Fxx-K30 Noise Figure Measurement Application – R&S®FSW-K30, R&S®FSWP-K30, R&S®FSMR3-K30, R&S®FSV3-K30, R&S®FPS-K30, R&S®FSV-K30, R&S®FPL1-K30 - Specifications
MEASUREMENTS ON DEVICES WITH VERY HIGH NOISE FIGURE
Measurements of very high noise figure components are performed for a number of reasons. For instance, in a wide range of applications, devices under test (DUT) are characterized within a complex test setup that includes high losses before or after the low noise DUT. In case of high frequencies, the switch matrix with complex signal routing and cables might have a very high loss. In other cases, the device might be embedded in a test setup where direct access is physically impossible, on-wafer probing is one example for this case. Using conventional measurement equipment, the noise figure measurement of such a device is very unstable if not impossible at all.
24-Jun-2020 | AN-No. 1EF110
Rohde & Schwarz Russia: Catalog 2021 RU Interactive
Rohde & Schwarz Russia: Catalog 2021 RU Interactive
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