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  • R&S®FSV3000

    R&S®FSV3000 R&S®FSV3000 signal and spectrum analyzer Key facts Frequency range from of 10 Hz to 4, 7.5, 13.6, 30 or 44 GHz Analysis bandwidth up to 200 MHz SSB phase noise at 10 kHz offset (1 GHz): –107 dBc/Hz GUI with multi-touch, SCPI recorder and event based actions Options for for analog and digital signal analysis, including 5G NR 10Gbit/s LAN interface for faster data transfer (option) Fast

  • R&S®FSV Signal and Spectrum Analyzer

    R&S®FSV Signal and Spectrum AnalyzerThe right choice of general purpose analyzersOverview ModelsOptionsFeatures & BenefitsKey facts Frequency range up to 4/7/13.6/30/40 GHz Up to 160 MHz signal analysis bandwidth Convenient, intuitive operation with touchscreen based user interface 5 GHz 0.4 dB level measurement uncertainty up to 7 GHzKey factsFrequency range up to 4/7/13.6/30/40 GHzUp to 160 MHz

  • Prelaunch FSV3000 registration

    Prelaunch FSV3000 registration Signal spectrum analyzer fsv3000 R&S®FSV3000 and R&S®FSVA3000 spectrum analyzer family - available April 11th 2019 Be the first to receive news about the R&S®FSV3000 and R&S®FSVA3000 spectrum analyzer family and sign up here Key facts Ideal for 5G NR signal analysis Up to 400 MHz analysis bandwidth Optimized for high-speed analysis New, innovative user interface

  • R&S®FSV3000 Signal and Spectrum Analyzer - Product Brochure

    Measurements at the push of a button, capturing rare events with event based actions and simple script programming with the SCPI recorder – setting up complex measurements in no time is the strength of the R&S®FSV3000 signal and spectrum analyzer. Its other major advantage is its fast measurement speed, for high throughout in production applications.

  • R&S®FSVA3000/FSV3000 Getting Started

    Provides the information required to prepare the instrument for use and start working. Basic operations and handling are described.

    This download is available in the following languages:

  • R&S®FSV-K30 Noise Figure and Gain Measurements

    R&S®FSV-K30 Noise Figure and Gain MeasurementsOverview The schematic view of the test setup simplifies measurements on frequency-converting DUTs.Tabular representation of measurement results.Measurements on an amplifier.Key FactsThe R&S®FSV-K30 option expands the R&S®FSV or R&S®FSVA signal and spectrum analyzer by adding measurement functionality otherwise only provided by special noise

  • R&S®FSV-K40 Phase Noise Measurements

    R&S®FSV-K40 Phase Noise MeasurementsOverview Key Facts Phase noise measurement Measurement of residual FM/PM and jitter Evaluation aids Key FactsPhase noise is an important parameter in wireless communications systems. The R&S®FSV-K40 option enables the R&S®FSV and R&S®FSVA to perform fast and easy phase noise measurements in development and production.Equipped with the R&S®FSV-K40 option, the

  • R&S®FSV-K54 EMI Measurement Application

    R&S®FSV-K54 EMI Measurement ApplicationFinding, classifying and eliminating electromagnetic interferenceOverview Key Facts EMI bandwidths for commercial and military standards Standard EMI detectors: quasi-peak, CISPR‑average, RMS-average Linking of measurement markers to various EMI detectors Key FactsEMI bandwidths for commercial and military standardsStandard EMI detectors: quasi-peak,

  • R&S®FSV-K10 GSM/EDGE/EDGE Evolution Analysis

    R&S®FSV-K10 GSM/EDGE/EDGE Evolution AnalysisOverview Key Facts Supports GSM, EDGE, and EDGE Evolution and VAMOS Supports GSMK, QPSK, A-QPSK, 8PSK, 16QAM and 32QAM modulation Supports normal and high symbol ratesKey FactsSupports GSM, EDGE, and EDGE Evolution and VAMOSSupports GSMK, QPSK, A-QPSK, 8PSK, 16QAM and 32QAM modulationSupports normal and high symbol ratesSupport of normal, micro and pico

  • R&S®FSV-K70 Vector Signal Analysis

    R&S®FSV-K70 Vector Signal AnalysisOverview Key Facts Flexible modulation analysis from MSK to 64QAM Numerous standard-specific default settings Easy operation with graphical support Key FactsThe R&S®FSV-K70 option enables users to flexibly set the analysis of digitally modulated single carriers down to the bit level. The clearly structured operating concept simplifies measurements, despite the

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