Demonstrating that silicon carbide (SiC) has equal or lower noise levels relative to silicon (Si) is a barrier to entry. SiC device and module manufacturers surveyed their customer base and found that consider see EMI-related noise as a primary hindrance to adoption.
Download this white paper to learn about:
- EMI challenges associated with migrating a design from Si to SiC
- test tools and test methodology
- mitigation and optimization techniques
You’ll also find an EMI pre-compliance case study, "Wolfspeed SiC MOSFET drop-in replacement in an SMPS."