Enhance your RF power amplifier measurement setup

Enhance your RF power amplifier measurement setup

Improve your measurement setup

In many characterization and production test runs, a large amount of data needs to be taken. This needs to be done as quickly as possible with accuracy and repeatability options that meet the demanding specifications of the device under test. Deembedding of the test fixture helps improve the accuracy, while server based testing and instrument integrated sequencing increases production throughput and minimizes characterization time.

Latest communication standards increase the modulation complexity up to 4k QAM while in addition extend the signal bandwidth as we see it in Wi-Fi7. Enhancements on the test equipment allow to go above and beyond the resulting EVM requirements with noise cancellation on the analyzer and internal digital predistortion on the signal generator.

Learn how to enhance your RF power amplifier measurement setup with leading-edge solutions from Rohde & Schwarz.

Highlighted applications

Optimize your signal and spectrum analyzer to address the most stringent EVM requirements

How I/Q noise cancellation can help significantly improve the EVM performance of your signal and spectrum analyzer.

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Improve throughput in production and characterization

High throughput is the key production metric for efficient operation and reduce the cost per device. Using an approach related to the development setup helps to maintain correlation throughout the value chain.

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RF/microwave DUT deembedding

Excellent real-time baseband performance and the ability to easily import the scattering parameters of the active/passive two-port interconnection network via S2P files are invaluable for RF/microwave DUT deembedding.

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Digital Predistortion for improved EVM Performance

How DPD helps to enhance EVM test capabilities when applied to the vector signal generator for high DUT drive levels.

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Faster characterization of 5G RF frontends

Faster characterization of 5G RF frontends

More frequency bands and larger dynamic ranges increase the number of test points required in characterization and production of the latest RF frontends (RFFE). Actively managing test time and cost while maintaining quality is more important than ever before.

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