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Firmware per SwitchMatrix Titolo Versioni Ultima modifica Dimensione del file 03 24.08.2015 694 kB
R&S ZN-Z85 model .03 Switch Matrix - Specifications
File addizionali (1) Titolo Dimensioni Versione Data R&S®ZN-Z85 Open Source Acknowledgment 694 kB 03 24.08.2015
Measurements of very high noise figure components are performed for a number of reasons. For instance, in a wide range of applications, devices under test (DUT) are characterized within a complex test setup that includes high losses before or after the low noise DUT. In case of high frequencies, the switch matrix with complex signal routing and cables might have a very high loss. In other cases, the device might be embedded in a test setup where direct access is physically impossible, on-wafer probing is one example for this case. Using conventional measurement equipment, the noise figure measurement of such a device is very unstable if not impossible at all.
Jun 24, 2020 | AN-No. 1EF110
Rohde & Schwarz - Manuale d'uso per R&S®ZN-Z85 Switch Matrix
Manuale d'uso Rohde & Schwarz per R&S®ZN-Z84 Switch Matrix
Firmware per ZN-Z84 Titolo Versioni Ultima modifica Dimensione del file 03 24.08.2015 694 kB
Firmware per ZN-Z85 Titolo Versioni Ultima modifica Dimensione del file 03 24.08.2015 694 kB
File addizionali (1) Titolo Dimensioni Versione Data R&S®ZN-Z85 Open Source Acknowledgment 694 kB 03 24.08.2015