Download Center

The R&S®RTP and R&S®RTO oscilloscopes are capable of characterizing high speed datacom interfaces and performing in-depth signal integrity analysis.

English - Jul 15, 2024

English - Jul 16, 2025

The R&S®ZNB measures the signal integrity on the PCB, taking the needed test fixtures and probes into consideration – a complete solution in a compact format.

English - Mar 25, 2020

This application note describes how to use the R&S®RTO, R&S®RTE and R&S®RTM Digital Oscilloscopes for EUT monitoring of signal forms.

English - Apr 20, 2015

The R&S®RT-ZPR20 and R&S®RT-ZPR40 power rail probes with a 1:1 attenuation ratio have very little noise and sufficient bandwidth to not attenuate critical signal content.

English - Jul 17, 2018

With continuously increasing data rates, signal integrity in high speed digital designs becomes more and more demanding

English - Jul 8, 2022

The digital trigger of the R&S®RTP combined with the zone trigger offers versatile and flexible triggering capabilities for DDR memory interface measurements.

English - Sep 26, 2018

Common mode distortion of wide-bandgap power electronics probing

English - Nov 25, 2024

Verifying power integrity for DDR memories - The R&S ® RT-ZPR20 power rail probe is a specialized oscilloscope probe for very low-noise measurements on power.

English - Apr 5, 2017

Debugging and verifying the DDR DRAM memory interface in a system design can be challenging. The R&S®RTP high-performance oscilloscope zone trigger is ideal for READ/WRITE separation as a basis for analyzing signal integrity.

English - Feb 6, 2025

This application note provides an introduction to the DDR memory technology and explains common challenges, related to the specific nature of DDR data, command and control buses.

English - Oct 30, 2020

For system verification and debugging, eye diagram measurements are the most important tools for efficiently analyzing the signal integrity in any digital design

English - Feb 19, 2019

Generating models with a VNA and using these on an oscilloscope via the deembedding

English - May 22, 2023

In this paper a rapid characterization of high speed digital channels using a multiport VNA is demonstrated.The VNA is a major tool in the field of communication and signal processing.

English - Mar 18, 2020

Learn how systematic testing of filter combiners and RF components ensures standards conformance, detecting defects for optimal base station performance

English - Jan 9, 2025