Press Release 27-May-2024
Rohde & Schwarz presents its solutions for next generation wide bandgap device test and debug at PCIM Europe
Rohde & Schwarz will showcase its latest solutions for power electronics testing at PCIM Europe in Nuremberg from June 11 to 13. This year, the spotlight will be on solutions that address the challenges of testing and debugging the next generation of wide bandgap semiconductors in power electronic converters. The company’s experts will share their first-hand knowledge of applications such as inverter drive design, double pulse testing and EMI debugging, utilizing cutting-edge test instruments from Rohde & Schwarz.