AI data center solutions

AI data center

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Power, connectivity and security for data centers

Artificial intelligence (AI) is reshaping how industries operate, how decisions get made and how value gets created. AI is often associated with software, but its capability is fundamentally reliant on physical infrastructure. This is why AI data center availability has become critical across business sectors. These data centers are the foundation of modern AI, providing the massive computing power required to train, deploy and scale advanced AI models.

An AI data center features advanced infrastructure that is optimized for:

  • High-density GPU and accelerator clusters
  • Reliable, fast data transfer
  • Real-time data processing

These characteristics distinguish it from traditional data centers, which often rely on standard servers that would struggle with the intensive data processing capabilities required to support AI workloads.

As AI workloads continue to grow in scale and complexity, data center operators face new technical and operational demands. The challenges they face can be organized into three categories:

  • Connectivity: Ensuring fast and reliable data transfer within the center
  • Power: Efficient power management to address the significantly increased power consumption
  • Security: Safeguarding facilities against unauthorized access

Rohde & Schwarz combines decades of expertise in test and measurement to help customers address these challenges. We support operators, equipment manufacturers and technology providers with our comprehensive portfolio for data center validation and troubleshooting.

Connectivity and digital design

AI data centers require fast and reliable data transfer across servers, storage systems, switches and AI accelerators. With increasing workloads and data volumes, maintaining performance becomes increasingly difficult.

Key challenges include:

  • PCIe and Ethernet validation: Testing the high-speed cables required by data centers is a highly complex task that requires support for very high frequencies and a multiport setup.
  • Signal integrity analysis: Signal degradation, jitter, crosstalk and noise can impact performance reliability at multi-gigabit data rates.
  • PCB and interconnect testing: Verifying board designs, connectors and backplanes ensure efficient data transmission and minimize communication errors.
  • Clock generation and distribution: Maintaining precise timing and synchronization across complex systems guarantee stable operation and optimal throughput.
  • Power integrity: More functions, greater processing power and growing data rates make high-speed system-on-chips (SoCs) power designs challenging.

Comprehensive connectivity testing is the first step to addressing these challenges. Accurate measurements across development stages are essential to ensure high performance and reliability across AI data center interconnects.

Key connectivity elements in AI data centers, including high-speed cabling, xPU modules, connectors and memory, require precise validation to maintain performance and reliability.

Power infrastructure and wide bandgap semiconductors

The GPUs used by AI data centers consume up to 15 times more processing power than the CPUs of traditional data centers. It is anticipated that AI will drive a 165% increase in data center electricity demand by 2030. This increased consumption makes efficient power management a top priority.

Key challenges include:

  • High operational costs: High processing power means high energy consumption, which means high operational expenditure.
  • Thermal management: High power densities generate more heat, increasing cooling requirements and overall energy consumption.
  • Sustainability: Operators must balance growing computational demands with regulatory requirements and overall energy consumption.

These challenges can be addressed on multiple different levels. One of them is through the optimization of power use. Power efficiency testing supports the design of components and, ultimately, systems that reduce the needed processing power. For example, more efficient power conversion can reduce losses and thereby reduce overall energy consumption.

In addition, testing is necessary to ensure reliable power delivery, quality and stability, as problems here affect equipment performance and lifespan.

FAQs for data center power requirements

Physical security for data centers

Data centers store and process large amounts of sensitive data. Physical security is essential to protect them from threats that can disrupt services and compromise information.

Key challenges include:

  • Preventing unauthorized access: Security measures must be implemented at multiple levels to protect the personnel, equipment and sensitive data.
  • Evolving threats and data-bearing devices: Data centers are constantly confronted with new objects that can be used to sabotage the servers, as well as sophisticated methods for smuggling data-bearing devices.
  • Security staff shortages: Shortages may result in overworked staff, leading to increased risk of human error and possible security gaps.
  • Cost-effective 24/7 monitoring: Maintaining around-the-clock monitoring is expensive and requires substantial investment in both technology and personnel.
  • Privacy and health concerns: Security screening often raises concerns regarding the health and privacy of the persons being scanned.

Millimeter wave security scanners can help operators meet these challenges. They support efficient inspection of employees, visitors and deliveries while maintaining smooth facility operations. By combining high detection performance with fast throughput, they reduce vulnerabilities to physical threats, thereby ensuring the continuous availability of data center services.

 Checkpoint remote screening solution
Rohde & Schwarz helps to diversify Securitas' solution offering by remote checkpoints for data centers and other applications.

FAQs for data center security

How does Rohde & Schwarz support AI data centers?

Rohde & Schwarz has a comprehensive portfolio that covers connectivity, power and security for data centers.

Our solutions address:

  • High-speed interface testing
  • Power efficiency testing
  • Millimeter wave security screening

Benefit from our prefessional consultancy for your tailored solution.

Data center connectivity with high-speed interface testing

Rohde & Schwarz provides an integrated test and measurement ecosystem for the development, validation and compliance testing of high-speed digital interfaces. Our portfolio covers the entire range of tools needed to address timing, signal integrity and protocol-level verification challenges.

Discover:

  • Oscilloscopes: Time-domain analysis of multi-gigabit signals with deep acquisition memory, high sampling rates and advanced trigger and decoding capabilities
  • Signal generators: Precise stimulus signals for transmitter and receiver testing
  • Phase noise analyzers: Validation of clock quality and jitter transfer characteristics
  • Vector network analyzers (VNA): Frequency-domain characterization of channels, packages and PCB interconnects
  • Software and automation frameworks: Integrated measurement workflows and automated compliance testing

Together, these solutions enable engineers to move from component-level signal characterization to full system-level validation of high-speed digital interfaces. This integrated approach is essential to meet the demands of AI data centers.

Clock generation, clock distribution and control loop analysis

Rohde & Schwarz addresses the full spectrum of timing creation, propagation and feedback stability in electronic systems. These capabilities are essential in AI data centers, where timing precision and dynamic stability directly determine the performance and efficiency of high-speed interconnects.

  • Clock generation: Our signal generators provide ultra-low phase noise reference clocks used to define system timing in digital and RF designs. These sources serve as stable foundations for PLLs, SerDes interfaces and high-speed digital subsystems.
  • Clock distribution: Our oscilloscopes support tightly synchronized multi-channel acquisition, enabling precise measurements of skew, jitter and inter-lane timing in multi-gigabit interfaces.
  • Control loop analysis: Our MXO oscilloscopes with the frequency response analysis (FRA) capability enable direct measurement of loop gain and phase in systems such as switch-mode power supplies. Engineers can derive Bode plots, crossover frequency and stability margins while simultaneously observing time-domain switching behavior.

PCB interconnect testing and high-speed de-embedding

Rohde & Schwarz supports engineers with characterizing signal integrity in high-speed digital designs. As AI data center interconnects operate at increasingly high data rates, PCB traces and connectors become dominant sources of loss, reflection and distortion. De-embedding techniques separate these channel effects and reconstruct device behavior at a defined reference plane for accurate assessments of interconnect performance.

  • S-parameter characterization: Our VNAs measure S-parameters with high dynamic range and accuracy. These measurements form the basis for modeling insertion loss, return loss and crosstalk in high-speed interconnects.
  • High-accuracy de-embedding: Our oscilloscopes support the removal of channel effects from measured waveforms. This enables the reconstruction of interconnect behavior at a defined reference plane for high-speed digital and SerDes validation.
  • Wideband signal integrity analysis: We offer compliance and analysis options for our oscilloscopes that enable the wideband evaluation of high-speed channels, including eye diagram analysis, jitter characterization and frequency-dependent loss mechanisms that impact AI data center link performance.
  • Time-domain and frequency-domain correlation: We offer options for our VNAs that allow the user to correlate frequency-domain S-parameters with time-domain response. This enables direct visualization of reflections, impedance discontinuities and propagation effects in complex interconnect structures.

Data center power efficiency with wide bandgap testing

Wide bandgap (WBG) semiconductors enable better power efficiency by operating at higher voltages and faster frequencies than legacy silicon. Rohde & Schwarz supports the characterization of WBG semiconductors, such as silicon carbide (SiC) and gallium nitride (GaN).

In collaboration with PE-Systems, we provide an automated double pulse testing solution for characterizing WBG semiconductors:

  • Automated Double Pulse Tester: From PE-Systems, this tester provides a controlled and repeatable test environment for power semiconductor switching characterization
  • MXO 5 oscilloscope: With a high sampling rate and low noise, this oscilloscope enables accurate measurements of fast transients, overshoot, ringing and switching energy behavior.
  • Automated workflows: A dedicated software option automates stimulus generation, synchronized acquisition and embedded frequency-domain analysis. The entire Bode plot measurement is executed as an automated measurement sequence rather than a manual sweep and calculation process.

This solution supports improved efficiency, thermal management and stability in AI data center power delivery systems.

Benefit from our prefessional consultancy for your tailored solution.

Security screening with millimeter wave technology

Rohde & Schwarz develops millimeter wave imaging technology that enables high-resolution, real-time screening. Our scanners are non-invasive and safe for both operators and screened persons.

Discover:

  • Reliable detection of concealed threats and prohibited items
  • Fast and efficient screening with high throughput
  • Reduced operational disruption and improved user experience
  • Privacy-friendly and contactless inspection

Our millimeter wave-based screening solutions are ideal for physical security in modern AI data center facilities.

Benefit from our prefessional consultancy for your tailored solution.

FAQs for data centers

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