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A key challenge for embedded devices with DDR memories is to maintain signal integrity in the presence of power and ground rail fluctuations. This becomes even more important as supply voltages decrease and switching speed increases leading to tighter power rail tolerances and jitter requirements.

English - ۵ اپریل ۲۰۱۷

Describes the probe and its usage.

English - ۲۲ فروری ۲۰۲۳

Describes the probe to 3.

English - ۲۰ فروری ۲۰۲۲

Provides information on security issues when working with R&S®RT-Z in secure areas.

English - ۲۷ اکتوبر ۲۰۲۲

Increasing demands on power distribution networks have resulted in smaller DC rails, as well as a proliferation of rails that ensure clean power reaches the pins of integrated circuits.

English - ۷ مارچ ۲۰۱۷

Describes the probe interface extender and its usage.

English - ۲۰ فروری ۲۰۲۲