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A key challenge for embedded devices with DDR memories is to maintain signal integrity in the presence of power and ground rail fluctuations. This becomes even more important as supply voltages decrease and switching speed increases leading to tighter power rail tolerances and jitter requirements.

English - 5 kwi 2017

Describes the probe to 3.

English - 20 lut 2022

Describes the probe and its usage.

English - 22 lut 2023

Increasing demands on power distribution networks have resulted in smaller DC rails, as well as a proliferation of rails that ensure clean power reaches the pins of integrated circuits.

English - 7 mar 2017

Provides information on security issues when working with R&S®RT-Z in secure areas.

English - 27 paź 2022

Describes the probe interface extender and its usage.

English - 20 lut 2022