Brochures and Data Sheets for R&S®FSWP

The R&S®FSWP phase noise analyzer is a highend instrument designed to accurately analyze noise performance of key components in radar and communications systems. Using phase noise measurements, a device’s large-signal noise figure can be derived under real-world operating conditions.

This document provides the technical specifications of the R&S®FSWP phase noise analyzer and VCO tester.

The R&S®FSWP phase noise analyzer and VCO tester combines extremely low‑noise internal sources and cross‑correlation, delivering extremely high sensitivity for phase noise measurements. As a result, it takes just seconds to measure even highly stable sources such as those found in radar applications. Additional options such as pulsed signal measurements, residual phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the analyzer a unique test instrument.

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R&S®FSWP Phase Noise Analyzer and VCO Tester - Product Brochure EN

R&S®FSWP Phase Noise Analyzer and VCO Tester - Product Brochure DE

R&S®FSWP Phase Noise Analyzer and VCO Tester - Product Brochure

R&S®FSWP Phase Noise Analyzer and VCO Tester - Product Brochure RU

Enhanced Specifications for AM/FM/φM Modulation Analysis

Technical specifications of the noise figure measurement options: R&S®FSW-K30, R&S®FSWP-K30, R&S®FSMR3-K30, R&S®FSV3-K30, R&S®FPS-K30, R&S®FSV-K30, R&S®FPL1-K30.

This document provides the technical specifications of the R&S®FS-SNS smart noise sources.

The R&S®FS-SNS smart noise sources enable simple and accurate noise figure and gain measurements by automatically loading all necessary setup parameters and taking the environmental temperature into account. Measurement uncertainty is calculated automatically and can even be displayed on the result screen.

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R&S®FS-SNS Smart Noise Sources - Product Brochure

R&S®FS-SNS Smart Noise Sources - Product Brochure DE

This document provides the technical specifications of the R&S®FSx-K50 spurious measurement application.

This document provides the technical specifications of the R&S®VSE-K60/R&S®FSx-K60 transient measurement application, the R&S®VSE-K60C/R&S®FSx-K60C transient chirp measurements and the R&S®VSE-K60H/R&S®FSx-K60H transient hop measurements.

The R&S®VSE-K6 option measures all relevant parameters such as pulse duration, pulse period, pulse rise and fall times, power drop across a pulse, and intrapulse phase modulation, and produces a trend analysis over many pulses. The user selects which results should be displayed simultaneously on the screen. The R&S®VSE thus delivers a full picture of e.g. a radar system within seconds.

Test solutions for safety and security in the new aviation era

The R&S®VSE-K70x/FSx-K70x/FPx-K70x option enables users to flexibly analyze digitally modulated single carriers down to the bit level. The clearly structured operating concept simplifies measurements, despite the wide range of analysis tools.

Active electronically scanned array and antenna testing

Rohde & Schwarz signal and spectrum analyzers equipped with the R&S®FSx-K30 option form the basis of a solution to accurately measure the noise figure in the millimeterwave frequency range using the Y-factor method.