13 Results
R&S®FSWP Phase Noise Analyzer and VCO Tester - Product Brochure
The R&S®FSWP phase noise analyzer and VCO tester combines extremely low‑noise internal sources and cross‑correlation, delivering extremely high sensitivity for phase noise measurements. As a result, it takes just seconds to measure even highly stable sources such as those found in radar applications. Additional options such as pulsed signal measurements, residual phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the analyzer a unique test instrument.
R&S®FSx-K50 Spurious Measurement Application - Specifications
This document provides the technical specifications of the R&S®FSx-K50 spurious measurement application.
R&S®FSWP-K7CAL Enhanced Specifications for AM/FM/φM Modulation Analysis - Specifications
Enhanced Specifications for AM/FM/φM Modulation Analysis
R&S®VSE-K60(x) / FSW-K60(x) / FSWP-K60(x) Transient measurement application, transient hop measurements, transient chirp measurements - Specifications
This document provides the technical specifications of the R&S®VSE-K60 | R&S®VSE-K60C | R&S®VSE-K60H, of the R&S®FSW-K60 | R&S®FSW-K60C | R&S®FSW-K60H and of theR&S®FSWP-K60 | R&S®FSWP-K60C | R&S®FSWP-K60H.
R&S®FSWP Dynamic noise figure measurements - Application Card
The R&S®FSWP phase noise analyzer is a highend instrument designed to accurately analyze noise performance of key components in radar and communications systems. Using phase noise measurements, a device’s large-signal noise figure can be derived under real-world operating conditions.
R&S®FS-SNS Smart Noise Sources - Specifications
The R&S®FS-SNS smart noise sources enable simple and accurate noise figure and gain measurements by automatically loading all necessary setup parameters and taking the environmental temperature into account. Measurement uncertainty is calculated automatically and can even be displayed on the result screen.
R&S®FS-SNS Smart Noise Sources - Product Brochure
The R&S®FS-SNS smart noise sources enable simple and accurate noise figure and gain measurements by automatically loading all necessary setup parameters and taking the environmental temperature into account. Measurement uncertainty is calculated automatically and can even be displayed on the result screen.
Verifying the clock source - Application Card
The R&S®FSWP phase noise analyzer and VCO tester is the right tool for verifying clock sources.
R&S®Fxx-K30 Measure noise figure above 110GHz - Application Card
Rohde & Schwarz signal and spectrum analyzers equipped with the R&S®FSx-K30 option form the basis of a solution to accurately measure the noise figure in the millimeterwave frequency range using the Y-factor method.
R&S®Fxx-K30 Noise Figure Measurement Application - Specifications
Technical specifications of the noise figure measurement options for the R&S®Fxx signal and spectrum analyzers and the R&S®ZNL vector network analyzer from Rohde & Schwarz
R&S®VSE-K70/FSx-K70 Vector Signal Analysis - Specifications
The R&S®VSE-K70 option enables users to flexibly analyze digitally modulated single carriers down to the bit level. The clearly structured operating concept simplifies measurements, despite the wide range of analysis tools.
R&S®VSE-K6/FSx-K6 Pulse Measurement Application - Specifications
The R&S®VSE-K6 option measures all relevant parameters such as pulse duration, pulse period, pulse rise and fall times, power drop across a pulse, and intrapulse phase modulation, and produces a trend analysis over many pulses. The user selects which results should be displayed simultaneously on the screen. The R&S®VSE thus delivers a full picture of e.g. a radar system within seconds.
