7985 Results
Customize blocking tests and make sure to address parameters like frequency positions, levels or bandwidths when verifying RF device performance.
31-Oct-2019
This application note describes a method using the R&S ZVA to measure group delay of mixers and frequency converters with an embedded local oscillator very accurately.
27-Aug-2012 | AN-No. 1EZ60
This application note shows how to perform LTE terminal block error rate (BLER) and throughput tests under fading conditions with the R&S®CMW500 Protocol Tester and the R&S®AMU200A Fading Simulator.
27-Mar-2012 | AN-No. 1MA177
radiated conformance testing according to TS 38.141-2, Rel. 16
This application note describes all mandatory radiated RF transmitter tests (TS 38.141-2, chapter 6), according to Release 16.
20-Dec-2019 | AN-No. GFM324
This application note explains how to detect, characterize, find and document interferers in cellular networks using the R&S®FSH spectrum analyzer.
21-Oct-2014 | AN-No. 1EF89
This application note describes how to integrate R&S®ZVA/ZVB/ZVT vector network analyzers with AWR's electronic design automation (EDA) software. Measured data can be exported using the AWR® TestWave™ tool via GPIB/LAN and verified with simulated data.
01-Jun-2010 | AN-No. 1MA163
This application note describes how to generate and analyze wideband digitally modulated signals in the mm-wave range. Rohde & Schwarz measuring equipment and some 3rd party off-the-shelf accessories are used for both signal generation and analysis.
02-Sep-2014 | AN-No. 1MA217
This application note describes the techniques to measure the dielectric properties of materials using a vector network analyzer. It also shows methods for converting the s-parameters to dielectric properties.
23-May-2012 | AN-No. RAC-0607-0019
LTE-Advanced Technology Introduction
20-Aug-2012 | AN-No. 1MA169
RMS is one of the most common parameters in test and measurement. Mathematically, it is the quadratic mean of continuously varying values (waveform). R&S RTM-K32 option provides a digital RMS conversion function for a high-bandwidth RMS measurement.
17-Aug-2015
This application note describes how to use the LTE Frequency Division Duplex (FDD) and Time Division Duplex (TDD) measurement functionality provided by the R&S®CMW500 wideband radio communication tester to perform LTE transmitter and receiver measurements.
17-May-2013 | AN-No. 1CM94
Operating manuals commonly focus on explaining a dedicated feature of a single instrument. This application note examines a range of typical user tasks and how to solve them with the different instruments.
26-Apr-2013 | AN-No. 1GP72
This application note describes the differences in sweep speed between swept spectrum analyzers and modern spectrum analyzers with a wide-band FFT process, and how this improves the measurement speed for general spurious measurement.
10-Jul-2012 | AN-No. 1EF80
LTE Transmission Modes and Beamforming
10-Jul-2015 | AN-No. 1MA186
UMTS Long Term Evolution (LTE) Technology Introduction
14-Sep-2009 | AN-No. 1MA111
This application note discusses the basics of nonlinearities and describes the nonlinearity measurement using the R&S Value Instruments RF Signal Generator R&S®SMC100A and Spectrum Analyzer R&S®FSC.
20-May-2014 | AN-No. 1MA71
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017 & ANSI/NCSL Z540-1-1994 & ANSI/NCSL Z540.3-2006
Conditions of Purchase - Issued May 2023 - Latin America Brochures and Data Sheets Company Material
Oscilloscopes for education special edition Canada flyer
The certification has been performed in accordance with the requirements of AS9104/1:2012, including its implementation, and meets the requirements of the standard:
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