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R&S®FSWP Dynamic noise figure measurements - Application Card
The R&S®FSWP phase noise analyzer is a highend instrument designed to accurately analyze noise performance of key components in radar and communications systems. Using phase noise measurements, a device’s large-signal noise figure can be derived under real-world operating conditions.
R&S®FSWP Phase Noise Analyzer and VCO Tester - Specifications
This document provides the technical specifications of the R&S®FSWP phase noise analyzer and VCO tester.
R&S®FSWP Phase Noise Analyzer and VCO Tester - Product Brochure
The R&S®FSWP phase noise analyzer and VCO tester combines extremely low‑noise internal sources and cross‑correlation, delivering extremely high sensitivity for phase noise measurements. As a result, it takes just seconds to measure even highly stable sources such as those found in radar applications. Additional options such as pulsed signal measurements, residual phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the analyzer a unique test instrument.
R&S®FSWP-K7CAL Enhanced Specifications for AM/FM/φM Modulation Analysis - Specifications
Enhanced Specifications for AM/FM/φM Modulation Analysis
R&S®Fxx-K30 Noise Figure Measurement Application – R&S®FSW-K30, R&S®FSWP-K30, R&S®FSMR3-K30, R&S®FSV3-K30, R&S®FPS-K30, R&S®FSV-K30, R&S®FPL1-K30 - Specifications
Technical specifications of the noise figure measurement options: R&S®FSW-K30, R&S®FSWP-K30, R&S®FSMR3-K30, R&S®FSV3-K30, R&S®FPS-K30, R&S®FSV-K30, R&S®FPL1-K30.
R&S®VSE-K6 Pulse Measurement Application – R&S®FSW/ FSV3/ FSV/ FSWP/ FPS-K6, R&S®FSWP-K6P, R&S®FSW/ FSWP-K6S, R&S®FSMR3-K6, R&S®VSE-K6, R&S®VSE-K6A - Specifications
This document provides the technical specifications of tthe R&S®VSE-K6 pulse measurement application.
R&S®FS-SNS Smart Noise Sources - Product Brochure
The R&S®FS-SNS smart noise sources enable simple and accurate noise figure and gain measurements by automatically loading all necessary setup parameters and taking the environmental temperature into account. Measurement uncertainty is calculated automatically and can even be displayed on the result screen.
R&S®FS-SNS Smart Noise Sources - Specifications
This document provides the technical specifications of the R&S®FS-SNS smart noise sources.
R&S®Fxx-K30 Measure noise figure above 110GHz - Application Card
Rohde & Schwarz signal and spectrum analyzers equipped with the R&S®FSx-K30 option form the basis of a solution to accurately measure the noise figure in the millimeterwave frequency range using the Y-factor method.
R&S®VSE-K70x/FSx-K70x/FPx-K70x Vector Signal Analysis Application - Specifications
This document provides the technical specifications of the R&S®VSE-K70x/FSx-K70x/FPx-K70x vector signal analysis application.
Stay ahead in radar and electronic warfare testing - Brochure
Active electronically scanned array and antenna testing
R&S®VSE-K60(x) / FSW-K60(x) / FSWP-K60(x) / FSV3-K60(x) Transient measurements - Specifications
This document provides the technical specifications of the R&S®VSE-K60/R&S®FSx-K60 transient measurement application, the R&S®VSE-K60C/R&S®FSx-K60C transient chirp measurements and the R&S®VSE-K60H/R&S®FSx-K60H transient hop measurements.
R&S®FSx-K50 Spurious Measurement Application - Specifications
This document provides the technical specifications of the R&S®FSx-K50 spurious measurement application.