Rohde & Schwarz News Magazine

Fig. 1: On-wafer measurement at 300 GHz with the millimeterwave prober from MPI and the R&S®ZVA network analyzer with frequency converters.
217 | General-purpose measurements

All-in-one solution for on-wafer characterization of millimeterwave components

Due to the increasing integration of components, testing them via coaxial ports is less frequently an option, since many of them no longer have coaxial ports. Instead, components are characterized directly on the wafer, a task requiring both a network analyzer and a probe station. An all-in-one solution of this type is now available from Rohde & Schwarz.

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