Electronic design

Deembedding Test Fixtures For High-Speed Digital Applications

In high-speed digital measurement applications, test fixtures are commonly used to connect devices under test to measurement equipment. Characterization, and analysis in the time and frequency domains that accounts for various constraints helps to remove the influence of these fixtures.

Name
Type
Version
Date
Size
1SL393_e_DeembedTestFixtures

In high-speed digital measurement applications, test fixtures are commonly used to connect devices under test to measurement equipment. Characterization, and analysis in the time and frequency domains that accounts for various constraints helps to remove the influence of these fixtures.

Type
Application Note
Version
2e
Date
26-May-2023
Size
4 MB
Deembedding files

Touchstone files (*.sxp) for the test fixture, signal trace TX1

Type
Application Note File
Version
1e
Date
03-May-2023
Size
28 MB
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