This webinar is intended for engineers working on the design and testing of high-speed digital electronics. Before verifying a design, the VNA must be calibrated to make sure that only the DUT will be measured. When using coaxial adapters, the calibration can be carried out in a straightforward way. However, many DUTs such as those on printed circuit boards do not have coaxial adapters, necessitating using fixtures to adapt to the special connectors. S-parameter de-embedding can be used to accurately compensate fixture effects and lead-ins.

We will begin with a short introduction into the basics of S-parameters and calibration. You will also get an overview of fixture compensation methods. In the main part of this webinar we will present and demonstrate advanced de-embedding and fixture modelling, as defined in IEEE STD 370. We will discuss use cases such as PCB test with de-embedding, connector test fixture compensation, cable test fixture compensation, SoC test fixture compensation, RF devices without coaxial connectors and more. Practical examples and demonstrations will illustrate the methods and use cases.