Application Firmware R&S®FS-K30 provides the high-grade analyzers with features otherwise only provided by special noise measurement systems. At a specified frequency or in a selectable frequency range the following parameters can be measured:
- Noise figure in dB
- Noise temperature in K
- Gain in dB
Compared to conventional noise measurement systems, R&S®FS-K30 used with the Analyzers R&S®FSP/FSU or R&S®FSQ has the advantage that a large variety of further RF measurements can also be performed.