45 Results
Models: R&S®MXO5C-43, R&S®MXO5C-45, R&S®MXO5C-410, R&S®MXO5C-420, R&S®MXO5C-81, R&S®MXO5C-82, R&S®MXO5C-83, R&S®MXO5C-85, R&S®MXO5C-810, R&S®MXO5C-820
This document provides the technical specifications of the MXO 5C series oscilloscope.
Superior time and frequency measurements. Compact for rackmount and bench applications.
Analyzing power designs for high-speed SoCs with multiphase buck converters
13-Jan-2025
Models: R&S®MXO5C-43, R&S®MXO5C-45, R&S®MXO5C-410, R&S®MXO5C-420, R&S®MXO5C-81, R&S®MXO5C-82, R&S®MXO5C-83, R&S®MXO5C-85, R&S®MXO5C-810, R&S®MXO5C-820
Models: R&S®MXO5C-43, R&S®MXO5C-45, R&S®MXO5C-410, R&S®MXO5C-420, R&S®MXO5C-81, R&S®MXO5C-82, R&S®MXO5C-83, R&S®MXO5C-85, R&S®MXO5C-810, R&S®MXO5C-820
Rohde & Schwarz user manual for the R&S MXO 5C oscilloscopes
Mesures temporelles et de fréquences supérieures. Compact pour montage en baie et applications de banc.
Instrument Security Procedures for R&S® MXO 5C
優れた時間測定と周波数測定 ラックマウントやベンチアプリケーションに適したコンパクトな筐体
优异的时域和频域测量。 紧凑型设计,适合机架和工作台应用。
The MXO 5C (C for compact) delivers breakthrough MXO 5 series oscilloscope technology in a 2 HU form factor.
R&S®MXO 5C Oscilloscope/Digitizer Next generation oscilloscope in a 2U-high form factor - Fact Sheet Brochures and Data Sheets
시간 도메인 측정과 주파수 도메인 측정의 새로운 기준 연구 개발과 생산 업무를 모두 만족하는 컴팩트 오실로스코프
Medidas de tiempo y frecuencia al más alto nivel. Formato compacto para montaje en rack y aplicaciones de sobremesa.
15-May-2024
Rohde & Schwarz introduces the MXO 5C series, the world’s most compact oscilloscope with up to 2 GHz bandwidthThe new MXO 5C is the first oscilloscope without an integrated display from Rohde & Schwarz.
01-Oct-2024
Rohde & Schwarz showcases its cutting-edge test solutions for consumer electronics at CETEX 2024 in AmsterdamRohde & Schwarz exhibits advanced T&M solutions that address emerging challenges in consumer electronics development at CETEX Consumer Electronics Test & Development Forum and Expo at RAI in Amsterdam.
27-May-2024
Rohde & Schwarz presents its solutions for next generation wide bandgap device test and debug at PCIM EuropeRohde & Schwarz will showcase its latest solutions for power electronics testing at PCIM Europe in Nuremberg, addressing challenges of testing and debugging the next generation of wide bandgap semiconductors in power electronic converters.
23-Jan-2025
Rohde & Schwarz presents R&S ScopeStudio, a PC-based oscilloscope solution to boost development teamsRohde & Schwarz launches R&S ScopeStudio, an innovative application that brings the functionality of the MXO series oscilloscopes to a PC. It allows engineers to visualize, analyze, document and share oscilloscope measurements, making development teams more efficient.
28-Oct-2024
Rohde & Schwarz at electronica 2024: Test and measurement solutions from the everyday to the extraordinaryTest and measurement technology leader Rohde & Schwarz with decades of expertise is set to showcase at electronica 2024, held in its home city Munich. Visitors will be able to experience the company’s wide range of solutions designed to help them tackle their test and measurement challenges in the development, verification and production of electronic components and devices – from the everyday to the extraordinary.
11-Jun-2024
Rohde & Schwarz presents R&S RT-ZISO isolated probing system for precise measurements of fast switching signalsRohde & Schwarz has developed the R&S RT-ZISO isolated probing system for extremely accurate measurements of fast switching signals, especially in environments with high common-mode voltages and currents.
17-Jul-2024
With first ASIC-based zone triggering for MXO oscilloscopes, Rohde & Schwarz breaks acquisition rate recordsRohde & Schwarz introduces the industry’s first ASIC-based zone triggering for the MXO oscilloscope series. It can offer the world’s fastest zone trigger update rate of up to 600.000 waveforms per second and less than 1.45 us blind time between trigger events.
Selecting Your Next Oscilloscope:
If you are selecting your next oscilloscope and want more insight on how to understand ENOB values measured and published by oscilloscope manufacturers, this document is for you. The effective number of bits (ENOB) is a way of quantifying the quality of analog to digital conversion. A higher ENOB means that voltage levels recorded in analog to digital conversion are more accurate. Understanding oscilloscope vendor-supplied ENOB values can be complex. This document focuses on interpretation of measured ENOB results made on oscilloscopes rather than the math behind ENOB calculations.
21-Jun-2024 | AN-No. 1TD12
Power electronics Test & Measurement solutions | 전력 전자 T&M 솔루션 | Component testing, product design, production and compliance testing | 컴포넌트 테스트, 제품 설계, 생산 테스트 및 적합성 테스트 - Flyer Brochures and Data Sheets Flyer
Power electronics T&M solutions | 功率電子測試與量測解決方案 | Component testing, product design, production and compliance testing | 元件測試、產品設計、生產和一致性測試 - Flyer Brochures and Data Sheets Flyer
Oscilloscope test applications include debugging complex electronic circuits, measuring high-speed-bus signal integrity and characterizing power electronics with hazardous voltage levels. Measurement accuracy and operator safety depend on these probes and accessories.
Oscilloscope innovation. Measurement confidence. - Flyer Brochures and Data Sheets Flyer