Advanced deembedding - accurate fixture modelling for precise VNA measurements of non-coaxial DUTs


This webinar is intended for engineers working on the design and testing of high-speed digital electronics. Before verifying a design, the VNA must be calibrated to make sure that only the DUT will be measured. When using coaxial adapters, the calibration can be carried out in a straightforward way. However, many DUTs such as those on printed circuit boards do not have coaxial adapters, necessitating using fixtures to adapt to the special connectors. S-parameter de-embedding can be used to accurately compensate fixture effects and lead-ins.

We will begin with a short introduction into the basics of S-parameters and calibration. You will also get an overview of fixture compensation methods. In the main part of this webinar we will present and demonstrate advanced de-embedding and fixture modelling, as defined in IEEE STD 370. We will discuss use cases such as PCB test with de-embedding, connector test fixture compensation, cable test fixture compensation, SoC test fixture compensation, RF devices without coaxial connectors and more. Practical examples and demonstrations will illustrate the methods and use cases.


Joern Pfeifer studied Electronics Engineering at the University of Applied Sciences in Emden, Germany, and graduated with a degree in High Frequency Engineering. As an Application Engineer, he joined Rohde & Schwarz in 2016 and focuses on high speed digital design applications. He is a contributing member of the OPEN Alliance Automotive Ethernet TC9 working group.

Joern Pfeifer