Demystifying deembedding for testing high-speed digital and RF signals

Webinar: Demystifying deembedding for testing high-speed digital and RF signals

This webinar is created for engineers who deal with high-speed digital and RF signal measurements while using plenty of cables, converters, adapters, text fixtures, amplifiers etc. It will explore the impact of the measurement setup on the results and the methods that can help you obtain the real signal of the device under test, something that is required by multiple standards.

You will be able to learn in great detail about the error sources such as bandwidth limitation, impedance mismatch, coupling and probing effects. We will discuss and use demonstrations to show how you can model and eliminate those errors. Defining system parameters, extracting and importing S parameters and observing the deembedded response are key steps of an easy deembedding process. We will be demonstrating this with an oscilloscope, including the necessary software and real-time hardware options.


Jithu Abraham works for Rohde & Schwarz as a product manager for the UK, Ireland and the Benelux region, specializing in oscilloscopes. He enjoys all aspects of high-speed digital, wireless communication, efficient power conversion and all the challenges they bring. Jithu holds an engineering degree in electronics and communication from the Anna University in India and a master’s degree in RF systems from the University of Southampton. He has been working for Rohde & Schwarz for over 12 years.

Jithu Abraham

Guido Schulze has more than 20 years of experience in high-speed digital testing. For the last ten years, he has worked as a product manager for the oscilloscope product division at Rohde & Schwarz. He specializes in high-end models and their respective applications.

Guido Schulze