High-speed digital interface testing, PCIe testing

PCIe – peripheral component interconnect express

PCIe – Successfully verify and optimize your system design

Design verification and debugging - Compliance testing

The PCIe architecture is the core of most computer designs and connects the processor and memory subsystems to the endpoint devices via the root complex. The growing demand for speed is driving standardization efforts in PCI-SIG and their adoption in data centers, PCs and embedded applications. Working closely with PCI-SIG, Rohde & Schwarz provides a wide range of solutions for PCIe compliance testing.

In addition to compliance testing, Rohde and Schwarz PCIe test solutions help you efficiently verify and debug your design at the board and system level, including in the presence of other interfaces and wireless signals.

Related documents

Real-time deembedding with the R&S®RTP

Deembedding the test fixtures and cables is important for proper measurements in PCIe. With the option R&S®RTP-K122, the R&S®RTP offers real-time deembedding to measure and trigger on deembedded signals in real-time.

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Optimizing differential measurements on high-speed interfaces

The R&S®RT-ZM modular probe system offers measurements in differential mode and common mode as well as single-ended measurements. The ground connection prevents the circuit from floating and ensures stable and reproducible signals.

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Comparison of jitter measurements in time and frequency domain

Jitter can be measured in the time and frequency domains. While scope based TIE measurements allow measurement of all jitter types, phase noise analyzer based jitter measurements are restricted to clock signals – but offer unrivalled jitter sensitivity.

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Precise measurements on high-speed digital PCBs with the R&S®ZNB

With the R&S®ZNB-K20 extended time domain option, the R&S®ZNB provides accurate tests of eye diagram, rise time, skew, etc. on digital high-speed signal structures. Additional deembedding tools can be installed to remove the effects of lead-ins and lead-outs.

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Jitter Analysis with the R&S®RTO Oscilloscope

Jitter is a key concern in signal integrity analysis. With the R&S®RTP-K12 and R&S®RTO-K12 options, Rohde & Schwarz oscilloscopes can measure TIE jitter, period jitter, cycle-cycle jitter, etc. and offer result displays such as jitter track, histogram or spectrum.

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Verifying the true jitter performance of PCIe reference clocks (Refclk)

As data rates increase, the jitter limits for the PCIe Refclk are becoming tighter. Due to the superior jitter sensitivity of phase noise analyzers (PNA), the PCIe Gen5 specification has introduced PNA based testing to verify the true jitter performance of the Refclk.

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Related videos
Realtime deembedding
Real-time deembedding with the R&S®RTP

Realtime deembedding of a signal path with the R&S®RTP-K122 option. The R&S®RTP not only acquires deembedded waveforms, it also allows triggering on this deembedded signal.

Signal integrity measurements with jitter analysis
Jitter analysis with the R&S®RTO

Measurement of TIE jitter with the R&S®RTO-K12 option. Analysis of TIE jitter of a clock signal in statistics, track, histogram and spectrum view to detect disturbances on the clock.

Signal Integrity Measurements
Signal integrity analysis on a USB-C cable with the R&S®ZNA

In combination with the time domain option R&S®ZNA-K2 and the extended time domain option R&S®ZNA-K20, the R&S®ZNA VNA offers a variety of signal integrity measurements. The device under test, a USB-C cable, is analyzed in frequency and time domain as well as in eye diagramm representation.

Eye diagram analysis with the R&S®ZNB: introduction
Eye diagram analysis with the R&S®ZNB: introduction

Eye diagram measurements and eye mask testing with the R&S®ZNB-K20 extended time domain option. This option can be used to analyze jitter and noise as well as to apply emphasis and equalization on the measured eye diagram.

Eye diagram analysis with the R&S®ZNB: how to set up the measurements
Eye diagram analysis with the R&S®ZNB: how to set up the measurements

Eye diagram measurements and eye mask testing with the R&S®ZNB-K20 extended time domain option. This option can be used to analyze jitter and noise as well as to apply emphasis and equalization on the measured eye diagram.

Signal integrity testing on differential signal structures with the R&S®ZNB
Signal integrity testing on differential signal structures with the R&S®ZNB

Measurement of rise time, impedance, intra-pair skew, inter-pair skew, etc. with the R&S®ZNB-K20 extended time domain option.

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