Embedded power efficiency testing

Embedded power

Efficiency testing

Solutions for embedded power efficiency testing

Power designers face the challenge of increasing efficiency and performance requirements while meeting reliability standards, achieving higher power density and reducing cost. One approach to increasing efficiency gains is through faster switching with lower losses. However, higher dV/dt can result in higher switching losses, make it more difficult to control the gate drive, produce higher ripple current and increase EMI. Making accurate switching measurements with an oscilloscope and oscilloscope probe is challenging due to the need for higher resolution and issues related to increased common mode error at higher frequencies. Accurate measurements can be an even greater challenge for designers working with wide bandgap materials. Rohde & Schwarz oscilloscopes, power probes and software enable power designers to optimize their designs.

Measuring power efficiency on wide bandgap devices
Measuring power efficiency on wide bandgap devices
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Power designers migrating from silicon to wide bandgap

Many power designers are moving to wide bandgap (WBG) materials such as SiC and GaN to increase efficiency through faster switching. A WBG semiconductor's fast switching capability must be well characterized in order to optimize efficiency gains, reduce losses and avoid shoot through. A high-resolution, low-noise Rohde & Schwarz oscilloscope combined with a Rohde & Schwarz high voltage differential probe with superior common mode rejection across frequency allows designers to:

• Match simulation results to measured results

• Clearly observe ringing and overshoot/undershoot under varying load conditions

• Verify rise/fall time from hundreds of ps to 10s of ns

• Characterize the dead time

• Visualize the Miller region

High-resolution oscilloscopes and superior high voltage differential probes
High-resolution oscilloscopes
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Embedded power measurement equipment

Power designs are moving toward higher voltages with faster edge rates. Making power efficiency measurements requires a high-resolution oscilloscope and high voltage differential probes with top performance, large differential and common mode range, and high common mode rejection across the bandwidth.

Related products

R&S®RTM3000 / RTA4000

See more of your signal with the power of 10. With up to 1 GHz bandwidth, these oscilloscopes offer 10-bit vertical resolution and ultra deep memory for longer acquisitions at full bandwidth.

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R&S®RTE1000/RTO2000

These fully integrated multi-domain oscilloscopes are excellent tools for analyzing switching behavior and debugging EMI issues. These scope series have up to 6 GHz bandwidth, 16-bit vertical resolution and up to 2 Gsample maximum memory depth.

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R&S®RT-ZHD high voltage differential probes

Designed in-house with superior performance, large differential and common mode range and superior common mode rejection across the bandwidth.

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Related topics

EMI debugging of embedded power electronics designs

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Power integrity testing

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Verification and debugging

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