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How are SI, PI and EMI Related to Each Other
Duration: 1 hour Language: EN
VNA: Pulse Measurements and Analysis
Presented by Jamie Lunn, Rohde & Schwarz
Which Probe to Choose for Digital and High-Voltage Applications
Presented by Alexander Küllmer and Pasi Suhonen, Application Engineers
Bode Plot Measurements with Oscilloscopes
Presented by Kenneth Rasmussen, Rohde & Schwarz
OTA Fundamentals and Rohde & Schwarz Solutions
RF Connector Care and Good Practices
Presented by Jamie Lunn, Rohde & Schwarz UK Ltd
CMsquares Sequencer - ONE Graphical Scripting Tool for All Your Automated 5G Testing Needs
Automotive Ethernet Measurements
Presented by Alexander Kuellmer - Application Engineer Digital Debug Tools
Oscilloscope Fundamentals
VNA: Noise Figure Measurements
VNA: IQ Mixer Characterization
Presented by Thilo Bednorz, Rohde & Schwarz
OTA Measurements for Base Stations
Presented by Markku Hintsala and Pontus Segerberg, Rohde & Schwarz
Characterizing an ADAS Radar in a transportable CATR based fully anechoic chamber with best-in-class performance
Presented by Fabricio Dourado, Rohde & Schwarz
Automotive Radar, Chirp Generation and Analysis
Presented by Oliver Voss and Alexander Küllmer, Rohde & Schwarz
