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A key challenge for embedded devices with DDR memories is to maintain signal integrity in the presence of power and ground rail fluctuations. This becomes even more important as supply voltages decrease and switching speed increases leading to tighter power rail tolerances and jitter requirements.

English - 2017年4月5日

Describes the probe to 3.

English - 2022年2月20日

Describes the probe and its usage.

English - 2023年2月22日

Increasing demands on power distribution networks have resulted in smaller DC rails, as well as a proliferation of rails that ensure clean power reaches the pins of integrated circuits.

English - 2017年3月7日

Provides information on security issues when working with R&S®RT-Z in secure areas.

English - 2022年10月27日

Describes the probe interface extender and its usage.

English - 2022年2月20日