Application Notes

Accurate Test Fixture Characterization and De-embedding

For measurements of non-connectorized devices, test fixtures, probes or other structures are used to adapt from the coaxial interface of the test setup to the device under test (DUT). For accurate measurements of the DUT, these lead-ins and lead-outs need to be characterized, so that their effects can be mathematically removed, i.e. de-embedded from the measurement results.

This application note provides practical hints to accurately characterize and de-embed these lead-in and lead-out structures with R&S Vector Network Analyzers ZNA, ZNB, ZNBT and ZND. As de-embedding is also essential in other test equipment like oscilloscopes, etc., this guide also describes, how lead-ins and lead-outs can be accurately characterized with a VNA and then exported as an S-Parameter file to be used by other test instruments.

Name
Type
Version
Date
Size
1SL367_0e_Test_Fixture_Characterization_and_De-embedding

This application note provides practical hints to accurately characterize and de-embed these lead-in and lead-out structures with R&S Vector Network Analyzers ZNA, ZNB, ZNBT and ZND.

Type
Application Note
Version
1.0
Date
19-Sep-2022
Size
2 MB