RF & microwave components

MEASUREMENTS ON DEVICES WITH VERY HIGH NOISE FIGURE

Measurements of very high noise figure components are performed for a number of reasons. For instance, in a wide range of applications, devices under test (DUT) are characterized within a complex test setup that includes high losses before or after the low noise DUT. In case of high frequencies, the switch matrix with complex signal routing and cables might have a very high loss. In other cases, the device might be embedded in a test setup where direct access is physically impossible, on-wafer probing is one example for this case. Using conventional measurement equipment, the noise figure measurement of such a device is very unstable if not impossible at all.

Name
Type
Version
Date
Size
1EF110_e_FSW-K30 High Noise Figure

This application note describes a technique to perform the noise figure measurement on lossy devices like attenuators, or on devices embedded into in test setups with high loss in front of the low noise amplifiers. The R&S®FSW-K30 noise figure measurement application performs this important measurement with a signal and spectrum analyzer using the Y-factor method. Key for this technique is a modified noise source with high level noise output signal that stimulates the device under test, and a sensitive spectrum analyzer that captures the signal from the device.

Type
Application Note
Version
1e
Date
24-Jun-2020
Size
570 kB
Related solutions