background
Oscilloscopes EMC Power electronics

Part 1a: Test and Setup design challenges

Session a: Measurements of Currents and High voltages

Speaker: Nicholas LeBas from Rohde & Schwarz

Abstract:

  • How to adapt my test setups to wide bandgap materials like SiC or GaN?
  • Which dynamic range do I need?
  • Do I need an optical isolated Probe?

Request information

Do you have questions or need additional information? Simply fill out this form and we will get right back to you.
For service/support requests, please go here to log in or register.

Marketing permission

Your request has been sent successfully. We will contact you shortly.
An error is occurred, please try it again later.