More signal details thanks to high time resolution across the entire memory depth
With a sampling rate of 5 Gsample/s, the R&S®RTE-B1 option provides a maximum time resolution of 200 ps for all digital channels. This sampling rate is available across the entire memory depth of 100 Msample per channel. As a result, the MSO option is even capable of detecting critical events such as narrow or widely separated glitches.
Precise triggering on signal events
The R&S®RTE-B1 offers numerous trigger types for debugging and analysis, such as edge, width, pattern and serial pattern. These triggers can be combined with holdoff conditions. For the trigger source, the user can choose between individual digital channels or bus signals.
High acquisition and analysis rate for fast fault finding
Signal processing of the digital waveforms is done in hardware. This extends from acquisition and triggering to analysis functions such as cursor functions and measurements, and even includes the visualization of the results. This allows an acquisition and analysis rate of more than 200 000 waveforms per second, ensuring that rare events are detected quickly and reliably.
Straightforward display of digital signals
The R&S®RTE-B1 option supports 16 digital channels and decoding of up to 4 parallel buses simultaneously. Each bus is represented by an icon on the edge of the screen. The icons can be dragged and dropped onto the screen. The Rohde & Schwarz SmartGrid function supports flexible placement of the relevant signals in a suitable diagram. The icon clearly shows the current status of all activated logic channels (high, low, toggle) regardless of the other oscilloscope settings.
The user configures the parallel buses according to the actual bus topology and defines which digital channels are part of the bus, where the binarization decision threshold is placed and whether it is a clocked or unclocked bus. The decoded buses are displayed in a bus format or as an analog waveform. For clocked buses, the decoded contents can also be displayed in tabular format.
To allow efficient analysis of the measurement waveforms, the R&S®RTE-B1 MSO option offers a wide selection of automatic time measurements, including statistical evaluation. Automatic measurements can be performed on all digital channels and their logical combinations.
In addition to time measurements, the cursor also supports the decoding of the bus value at the cursor position.
The history function enables the user to access specific measurement waveforms in the acquisition memory and to apply analysis functions to them.
Analysis of serial protocols, even with digital channels
The protocols of serial interfaces such as I2C, SPI, UART/ RS-232, CAN, LIN, FlexRay™ and I2S can also be triggered and decoded using the digital channels of theR&S®RTE-B1 option and the appropriate serial protocol options.
Low test point loading due to active probe
The 16 digital inputs are grouped into two logic probes with eight channels each. High input impedance combined with low input capacitance of 100 kΩ || 4 pF ensures high signal fidelity and low loading of the test points.