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15 Results
On-wafer testing
Discover solutions for on-wafer testing, die testing and RF probing. Explore wafer testing equipment, such as vector network analyzers and probe stations.
Solutions
Modal Calibration RF & Microwave testing
New modal calibration minimizes GSSG probe coupling for accurate RF results. Learn how it works now.
Solutions
RF & microwave testing
Ensure frequency accuracy & stability with our RF testing solutions at Rohde & Schwarz . Get details now!
Solutions
On-wafer qualification of RF components
Early wafer-level qualification of RF components ensures quality and saves money
14-Jul-2022
Applications
On-wafer characterization at sub-THz frequencies
On-wafer characterization at sub-THz frequencies
12-Dec-2023
Applications
Three-port on-wafer mixer measurements up to the THz range on MPI probe stations
Three-port on-wafer mixer measurements up to the THz range on MPI probe stations
14-Aug-2025
Applications
Differential RF on-wafer measurements up to 110 GHz on MPI probe stations
Differential RF on-wafer measurements up to 110 GHz on MPI probe stations
14-Aug-2025
Applications
Challenges of on-wafer characterization of BAW filter harmonics
Therefore, especially the characterization of the second harmonic (H2) performance of BAW filters on-wafer poses a challenge. Typical on-wafer filter probing techniques are not representative of a filter’s H2 response in a final module. Also, the time intensive nature of H2 characterization limits the resolution of measurement data across the wafer.
On demand
06-May-2025 | Online News | Test & measurement
Rohde & Schwarz hosts RF Testing Innovations Forum 2025, helping design engineers elevate their RF expertiseRohde & Schwarz hosts the RF Testing Innovations Forum 2025, taking place online over two days, providing a virtual platform for RF design engineers to enhance their RF expertise and engage with industry leaders at the forefront of innovation.
News
Measurements on devices with very high noise figure
This application note describes a technique to perform the noise figure measurement with FSW-K30 on lossy devices like attenuators with high loss in front of the low noise amplifiers.
24-Jun-2020 | AN-No. 1EF110
Applications
Device characterization & production test
Stable RF component production test solutions for constant quality. R&S offers leading-edge test solutions from on-wafer to final devices.
Solutions
Passive component testing | S parameter measurements
Choose Rohde & Schwarz test solutions for passive components for reliable test results and test speed reasons.
Solutions
Load pull testing
Learn about different aspects of load pull analysis and testing. Discover a load pull measurement setup from an industry leader in load pull testing. Explore now.
Solutions
RF Testing Innovations Forum 2025 | Virtual Event
Join RF experts from Rohde & Schwarz and the industry live and online for the first time at the RF Testing Innovations Forum 2025!
Solutions
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