Ensure frequency accuracy & stability with our RF testing solutions at Rohde & Schwarz . Get details now!

06-May-2025 | Online News | Test & measurement

Rohde & Schwarz hosts the RF Testing Innovations Forum 2025, taking place online over two days, providing a virtual platform for RF design engineers to enhance their RF expertise and engage with industry leaders at the forefront of innovation.

Early wafer-level qualification of RF components ensures quality and saves money

14-Jul-2022

Discover solutions for on-wafer testing, die testing and RF probing. Explore wafer testing equipment, such as vector network analyzers and probe stations.

On-wafer characterization at sub-THz frequencies

12-Dec-2023

Three-port on-wafer mixer measurements up to the THz range on MPI probe stations

14-Aug-2025

Differential RF on-wafer measurements up to 110 GHz on MPI probe stations

14-Aug-2025

Therefore, especially the characterization of the second harmonic (H2) performance of BAW filters on-wafer poses a challenge. Typical on-wafer filter probing techniques are not representative of a filter’s H2 response in a final module. Also, the time intensive nature of H2 characterization limits the resolution of measurement data across the wafer.

Partner solutions – probe stations

Join RF experts from Rohde & Schwarz and the industry live and online for the first time at the RF Testing Innovations Forum 2025!

This application note describes a technique to perform the noise figure measurement with FSW-K30 on lossy devices like attenuators with high loss in front of the low noise amplifiers.

24-Jun-2020 | AN-No. 1EF110

Stable RF component production test solutions for constant quality. R&S offers leading-edge test solutions from on-wafer to final devices.

Learn about different aspects of load pull analysis and testing. Discover a load pull measurement setup from an industry leader in load pull testing. Explore now.

Choose Rohde & Schwarz test solutions for passive components for reliable test results and test speed reasons.