Signal integrity test

Signal Integrity: PCB and Interconnect test

Proper design of PCB traces, vias, connectors and cables is essential to ensure Signal Integrity on the transmission channel. Performance is typically characterized by insertion loss and return loss as well as near-end crosstalk (NEXT) and far-end crosstalk (FEXT). Giving insights to a potential EMI or EMS coupling path, mode conversion like e.g. differential to common mode conversion is often specified and needs to be tested. Frequency domain parameters are also transformed into the time domain to view discontinuities and impedance over the signal structure as well as signal rise/fall time, intra-pair and inter-pair skew. Also eye diagrams and eye mask tests are often performed based on the measured S-parameters.

To avoid a cumbersome TRM / TRL calibration with multiple standards, deembedding is required to accurately characterize lead-ins and lead-outs to the DUT (device under test). With this, the lead-ins and lead-outs are removed from the measurement and accurate measurements of the DUT can be done. The characterized lead-in also can be used for deembedding this signal path in an oscilloscope measurement.

With expertise in both the time and frequency domain and by working closely with the corresponding standardization bodies, Rohde & Schwarz provides a wide range of Signal Integrity solutions to test PCBs and interconnects and to characterize lead-ins for use in oscilloscopes to deembed from the measurement results.

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Poster: Signal integrity eye test

Get with this poster a guidance for Signal Integrity Eye Tests measuring at the transmitters or measuring at the receivers and how to generate an Eye Diagram using oscilloscopes and Vector Network Analyzers.

Use this poster as a reference in your lab. Register for a download PDF or a hardcopy version, printed for your lab.

Webinars for PCB and Interconnect test

Webinar: Selection, characterization and de-embedding of differential probes for accurate measurements of high-speed PCB signal structures

Webinar: Selection, characterization and de-embedding of differential probes for accurate measurements of high-speed PCB signal structures

This webinar addresses the key aspects for making accurate measurements with differential probes on high-speed PCB signal structures.

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Webinar: Advanced deembedding - accurate fixture modelling for precise VNA measurements of non-coaxial DUTs

Webinar: Advanced deembedding - accurate fixture modelling for precise VNA measurements of non-coaxial DUTs

This webinar is intended for engineers working on the design and testing of high-speed digital electronics.

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Signal integrity analysis on PCB

Webinar: Signal integrity analysis on PCB and interconnects

This webinar is created for engineers who work on signal integrity with digital designs. It will focus on aspects of channel influence through PCB and interconnects such as impedance mismatch, losses and frequency response on PCB material, unintended crosstalk and resonant structures.

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Documents for PCB and Interconnect test

Test fixture characterization and de-embedding

Test fixture characterization and de-embedding

For measurements of non-connectorized devices, test fixtures or probes are required to adapt from the coaxial interface of the test equipment to the device unter test. These lead-ins and lead-outs need to be characterized and de-embedded from the measurement results. This application note provides practical hints to accurately characterize and de-embed lead-in and lead-out structures with R&S Vector Network Analyzers.

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Testing insertion loss of PCB signal structures with Delta-L 4.0

Insertion loss per inch is a key metric for PCBs in PCIe designs. It needs to be measured for the section of a signal trace on a certain PCB layer, removing the effects of PCB probes and vias. Delta-L is the method of choice to derive this value, using test coupons of different lengths. Delta L 4.0 is a recent extension for PCIe 5.0 and 6.0 and is integrated in R&S®ZNx-K231.

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Precise measurements on high-speed digital PCBs with the R&S®ZNB

Precise measurements on high-speed digital PCBs with the R&S®ZNB

With the advanced time domain option, R&S®ZNB-K20, the R&S®ZNB provides accurate tests of eye diagram, rise time, skew, etc. on digital high-speed signal structures. Additional deembedding tools can be installed to remove the effects of lead-ins and lead-outs.

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The Importance of Accurate S-Parameters for PAM-4 Applications

The Importance of Accurate S-Parameters for PAM-4 Applications

Accurate S-Parameter measurements are required to characterize insertion loss, return loss and crosstalk of signal structures in high-speed digital designs. Channel Operating Margin (COM) and Effective Return Loss (ERL) are introduced to describe the channel performance for a defined transmitter and receiver model.

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Time Domain Measurements using Vector Network Analyzer ZNA

Time Domain Measurements using Vector Network Analyzer ZNA

Introduction to network analyzer based TDR/TDT measurements: impulse and step response, resolution in time and distance, step size and unabiguous range, windowing and time domain gating

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R&S®ZNB

Verify high frequency signal integrity on printed circuit boards

With growing data rates, PCB signal structures need to be designed for frequencies such as 40GHz and beyond. Growing need for back drill inspection and the corresponding inboard test of the functional signal structures require fast and fully automated test solutions.

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Rapid Characterization of High Speed Digital Channels using a Multiport VNA

Rapid Characterization of High Speed Digital Channels using a Multiport VNA

The Vector Network Analyzers (VNA) is the instrument of choice for characterizing high-speed digital channels. Compared to traditional 4-port VNAs, multiport VNAs like R&S®ZNBT provide significant advantages, when measuring IL, RL, NEXT and FEXT in multi-lane signal structures.

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Videos for PCB and Interconnect test

De-embedding and measuring a PCIe5 connector with R&S®VNA
De-embedding and measuring a PCIe5 connector with R&S®VNA

By reference to settings and measurements with a vector network analyzer R&S®ZNA we are demonstrating the de-embedding process of a PCIe5 connector integrated in a test fixture.

Signal Integrity Measurements

Signal integrity measurements

In combination with the advanced time domain option R&S®ZNA-K20, the R&S®ZNA vector network analyzer offers a variety of Signal Integrity measurements, like eye diagram, rise time, skew, etc.. A USB-C cable is analyzed in frequency and time domain.

Signal integrity testing on differential signal structures with the R&S®ZNB

Signal integrity testing on differential signal structures with the R&S®ZNB

Measurement of risetime, impedance, intra-pair skew, interpair-skew, etc. with the advanced time-domain option R&S®ZNB-K20.

TDR/TDT Analysis with R&S Oscilloscopes

TDR/TDT Analysis with R&S Oscilloscopes

TDR/TDT measurement, analyzing impedance and transmission loss with R&S®RTP-K130. The option includes an easy-to-use calibration wizard to move the reference plane of the measurement to the required position.

Eye diagram analysis with the R&S®ZNB: introduction

Eye diagram analysis with R&S®ZNB: Introduction

Measurement of eye diagrams and eye mask testing with the advanced time-domain option R&S®ZNB-K20. The option allows the analysis of jitter and noise as well as emphasis and equalization on the measured eye diagram.

Eye diagram analysis with the R&S®ZNB: how to set up the measurements

Eye diagram analysis with R&S®ZNB: How to set up the measurements

Measurement of eye diagrams and eye mask testing with the advanced time-domain option R&S®ZNB-K20. The option allows the analysis of jitter and noise as well as emphasis and equalization on the measured eye diagram.

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