High-speed digital interface testing, USB testing

USB – universal serial bus

System verification and debugging of USB designs

The USB interface is used to connect computers and peripheral devices. The demand for higher data rates and faster charging speed as well as the integration of Thunderbolt and DisplayPort technologies are driving standardization efforts in the USB Implementers Forum (USB-IF).

Rohde & Schwarz is working closely with USB-IF to provide powerful test solutions for interface testing, PCB, cable and connector testing, and also power delivery testing. Our test solutions help you efficiently verify and debug system level designs and get your products to market faster.

Webinars

Webinar: USB 3.2 electrical compliance testing

USB 3.2 electrical compliance testing

This webinar is intended for engineers who work on high-speed digital design and test.

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USB 3.2 compliance testing

USB 3.2 compliance testing

This webinar is intended for engineers who work on high-speed digital design and test. In particular, we will be focusing at USB interfaces. After a quick introduction into USB technology we will be discussing the details of USB 2.0 and 3.2 compliance testing. The webinar will enable you to learn common signal integrity issues, and we will be guiding you through related challenges.

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Compliance testing and signal integrity debugging of USB 3.2 interfaces

Compliance testing and signal integrity debugging of USB 3.2 interfaces

This webinar is intended for engineers who work on high-speed digital design and test. In particular we will be looking at USB interfaces. We will be starting with an introduction in the purpose, the technology and the different standards and applications of this digital interface. Challenges, specifications and test procedures open the webinar’s test & measurement core.

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Conformance Test failed

Conformance Test failed. What now?

Conformance tests are performed on serial data interfaces such as USB, HDMI and PCI Express to ensure interoperability between electronic devices and accessories. In cases where signal integrity problems are encountered, the R&S®RTP oscilloscope supports root cause analysis by providing powerful tools such as eye diagrams, jitter and noise separation as well as time domain reflectometry.

R&S®RTP164 high performance oscilloscope

Rohde & Schwarz and Eurofins Digital Testing bring advanced testing kit to high speed interface compliance test programs

The growth in high speed communications technologies has increased demand for compliance and compatibility testing in line with an ever increasing number of industry standards. Rohde & Schwarz is partnering with Eurofins Digital Testing to provide access to the latest high speed signal analysis and compliance testing tools with the R&S®RTP164 high-performance oscilloscope. Eurofins Digital Testing also has plans to provide certification services for high speed commu­nications technologies such as USB. Learn more in our flyer.

MOI Documents
Method of Implementation (MOI) for USB3.2 legacy cable test

Method of Implementation (MOI) for USB3.2 legacy cable test

This application note describes Methods of Implementation (MOI) for precise, fast, and error-free compliance testing of USB 3.2 Legacy Cable Testing for USB Type A, Type B, and Micro family connector types. Based on 5 Gbps and 10 Gbps signaling per lane with vector network analyzers from Rohde & Schwarz.

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Method of Implementation (MOI) for USB Type-C to Type-C Cable Assembly Compliance Tests

Method of Implementation (MOI) for USB Type-C to Type-C Cable Assembly Compliance Tests

This application note describes Methods of Implementation (MOI) for precise, fast, and error-free compliance testing of USB Type-C to Type-C cable assemblies supporting USB4 Gen3, USB4 Gen2, USB 3.2 Gen2, USB3.2 Gen1, and USB2.0.

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Related documents
Real-time deembedding with the R&S®RTP

Real-time deembedding with the R&S®RTP

Deembedding the test fixtures and cables is important for proper measurements in USB. With the option R&S®RTP-K122, the R&S®RTP offers real-time deembedding to measure and trigger on deembedded signals in real-time.

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Optimizing differential measurements on high-speed interfaces

Optimizing differential measurements on high-speed interfaces

The R&S®RT-ZM modular probe system offers measurements in differential mode and common mode as well as single-ended measurements. The ground connection prevents the circuit from floating and ensures stable and reproducible signals.

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Comparison of jitter measurements in time and frequency domain

Comparison of jitter measurements in time and frequency domain

Jitter can be measured in the time and frequency domains. While scope based TIE measurements allow measurement of all jitter types, phase noise analyzer based jitter measurements are restricted to clock signals – but offer unrivalled jitter sensitivity.

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Precise measurements on high-speed digital PCBs with the R&S®ZNB

Precise measurements on high-speed digital PCBs with the R&S®ZNB

With the R&S®ZNB-K20 extended time domain option, the R&S®ZNB provides accurate tests of eye diagram, rise time, skew, etc. on digital high-speed signal structures. Additional deembedding tools can be installed to remove the effects of lead-ins and lead-outs.

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Jitter Analysis with the R&S®RTO Oscilloscope

Jitter Analysis with the R&S®RTO Oscilloscope

Jitter is a key concern in signal integrity analysis. With the R&S®RTP-K12 and R&S®RTO-K12 options, Rohde & Schwarz oscilloscopes can measure TIE jitter, period jitter, cycle-cycle jitter, etc. and offer result displays such as jitter track, histogram or spectrum.

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Related videos
Signal integrity debugging

Signal integrity debugging on a USB 3.1 device with the R&S®RTP

Eye diagram measurements on a USB 3.1 Gen1 device with the R&S®RTP, including mask tests and eye measurements such as eye height, eye width and jitter histogram.

USB 3.1 interface debug with realtime deembedding

USB 3.1 Gen1 interface debugging with real-time deembedding

Signal integrity measurements on a USB 3.1 Gen1 device. With the option R&S®RTP-K122, the R&S®RTP offers real-time deembedding to measure and trigger on deembedded signals in real time.

Realtime deembedding

Real-time deembedding with the R&S®RTP

Realtime deembedding of a signal path with the R&S®RTP-K122 option. The R&S®RTP not only acquires deembedded waveforms, it also allows triggering on this deembedded signal.

Signal integrity measurements with jitter analysis

Jitter analysis with the R&S®RTO

Measurement of TIE jitter with the R&S®RTO-K12 option. Analysis of TIE jitter of a clock signal in statistics, track, histogram and spectrum view to detect disturbances on the clock.

Signal Integrity Measurements

Signal integrity analysis on a USB-C cable with the R&S®ZNA

In combination with the time domain option R&S®ZNA-K2 and the extended time domain option R&S®ZNA-K20, the R&S®ZNA VNA offers a variety of signal integrity measurements. The device under test, a USB-C cable, is analyzed in frequency and time domain as well as in eye diagramm representation.

Eye diagram analysis with the R&S®ZNB: introduction

Eye diagram analysis with the R&S®ZNB: introduction

Eye diagram measurements and eye mask testing with the R&S®ZNB-K20 extended time domain option. This option can be used to analyze jitter and noise as well as to apply emphasis and equalization on the measured eye diagram.

Eye diagram analysis with the R&S®ZNB: how to set up the measurements

Eye diagram analysis with the R&S®ZNB: how to set up the measurements

Eye diagram measurements and eye mask testing with the R&S®ZNB-K20 extended time domain option. This option can be used to analyze jitter and noise as well as to apply emphasis and equalization on the measured eye diagram.

Signal integrity testing on differential signal structures with the R&S®ZNB

Signal integrity testing on differential signal structures with the R&S®ZNB

Measurement of rise time, impedance, intra-pair skew, inter-pair skew, etc. with the R&S®ZNB-K20 extended time domain option.

Application video USB compliance measruements video 01 screen

USB 2.0 compliance testing: 1/3 - Understanding the USB tree structure of a PC: presentation

Understanding the USB tree structure, vendor ID (VID) and product ID (PID) of a PC using tools like the USB Device Tree Viewer or Windows Device Manager.

Application video USB compliance measruements video 02 screen

USB 2.0 compliance testing: 2/3 - Understanding the USB tree structure of a PC: practical demo

Understanding the USB tree structure, vendor ID (VID) and product ID (PID) of a PC using tools like the USB Device Tree Viewer or Windows Device Manager.

Application video USB compliance measruements video 03 screen

USB 2.0 compliance testing: 3/3 - R&S®ScopeSuite

Compliance testing of a USB 2.0 device with the R&S®RTO. Test automation with the R&S®RTO-K21 option (R&S®ScopeSuite)

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