White paper: Testing SiC designs

Demonstrating that silicon carbide (SiC) has equal or lower noise levels relative to silicon (Si) is a barrier to entry. SiC device and module manufacturers surveyed their customer base and found that over 40% consider see EMI-related noise as a primary hindrance to adoption.

Download this white paper to learn about:

  • EMI challenges associated with migrating a design from Si to SiC
  • test tools and test methodology
  • mitigation and optimization techniques

You’ll also find an EMI pre-compliance case study, "Wolfspeed SiC OSFET drop-in replacement in an SMPS."