- Ideal for radar system manufacturers and developers who need to characterize frequency agile signals
- Includes analysis of hopping sequences
- Make use of our flexible subscription models
R&S®Cloud4Testing: Transient analysis application package
Cloud-based testing solution for radar applications and analysis of hopping and chirp signals


Transient analysis challenges call for lean solutions
Cloud-based software for characterization of frequency-agile signals, quick and easy
The R&S®Cloud4Testing provides quick and easy access to Rohde & Schwarz transient analysis testing essentials without having to make a big investment. Simply measure, analyze and process your individual RF data, on demand and on the go.
This transient analysis application package for the R&S®Cloud4Testing provides you with the access to the R&S®VSE-K60 transient analysis option, ideal for radar system manufacturers and developers who need to characterize frequency-agile signals, including analysis of hopping sequences (R&S®VSE-K60H) and chirps or FMCW signals (R&S®VSE-K60C).
The R&S®VSE-K60C option that displays the frequency response and calculates the deviation from the ideal linear phase, even for the non-pulsed FMCW radar signals commonly used in automotive radars.
The R&S®VSE-K60H automatically analyzes the hopping sequence of fast frequency hopping pulsed signals used in automotive and aerospace and defense applications.
Transient analysis – in the cloud
All you need to know about this subscription package
Measurement parameters:
- Frequency hopping signals: dwell time, settling time, switching time, frequency deviation, power, phase deviation, power ripple
- Chirp signals: frequency deviation, chirp begin, chirp length, chirp rate, chirp state deviation, phase deviation, power, power ripple
- Spectrogram and section of spectrogram, tabular display, frequency, frequency error, phase and amplitude versus time, FFT spectrum
- Pan and zoom functions to select analysis region using touch gestures in spectrogram, spectrum and time domain trace displays
- Trends and histograms for all parameters
- Hop/chirp statistics: standard deviation, average, maximum, minimum
- User-defined measurement parameters
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